Transport delay and jitter measurements

• US 7,912,117 B2
• Filed: 09/28/2006
• Issued: 03/22/2011
• Est. Priority Date: 09/28/2006
• Status: Active Grant

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Calvin, John C., Tan, Kan, Sepp, Kalev
• Primary Examiner(s): Ghebretinsae; Temesghen
• Application Number:
  US11/529,856
• Publication Number:
  US 20080080605A1
• Time in Patent Office: 1,636 Days
• Field of Search: 375224-228
• US Class Current: 375/226
• CPC Class Codes: G01R 29/26 Measuring noise figure; Measuring signal-to-noise ratio
• CPC Class Codes: G01R 31/31709 Jitter measurements; Jitter generators measuring jitter, noise figure or signal-to-noise ratio per se G01R29/26; analysis of tester signals G01R31/31901
• CPC Class Codes: H04L 1/205 jitter monitoring

Abstract

A method of measuring transport delay and jitter with a realtime oscilloscope using cross-correlation acquires waveforms from two test points in a system under test. Clock recovery is run on both waveforms to obtain respective rates and offsets. A time offset between the two waveforms is computed. The jitter from the two test points is filtered and a mean-removed cross-correlation coefficient is computed from the filtered jitters. A fractional delay is computed using interpolation based on LMS error, and the respective computational components are summed to compute a transport delay between the two test points. The transport delay may be used to adjust clock edges from one waveform for comparison with data transition edges of the other waveform to measure jitter.

Claims

1. A method of measurements comprising the steps of:

acquiring waveforms at two test points of a system under test;

running constant clock recovery on both waveforms to obtain respective offset values;

computing a time offset between the respective offset values;

filtering jitter from the two test points;

computing a mean-removed cross-correlation coefficient between the filtered jitter from the two test points;

computing a fractional delay; and

computing a transport delay by summing the time offset, fractional delay, and mean-removed cross-correlation coefficient.

2. The method as recited in claim 1 wherein the fractional delay computing step comprises the step of using interpolation based on a least mean squared error method.

3. The method as recited in claim 1 wherein the running step comprises the steps of:

obtaining a reference clock rate from one of the waveforms; and

multiplying the reference clock rate by a constant to obtain a data rate, the data rate being used in the running step for the other waveform.

4. The method as recited in claim 3 further comprising the steps of:

determining reference clock edges from one of the waveforms;

delaying the reference clock edges by the transport delay to obtain “

ideal”

clock edges;

determining data transition edges from the other of the waveforms; and

computing jitter as a function of the “

ideal”

clock edges and the data transition edges.