Dynamic chip control
First Claim
1. A method comprising:
- accessing a temperature value corresponding to a temperature of a semiconductor device;
selecting a target operating frequency;
accessing a voltage value that corresponds to said temperature value and said target operating frequency;
predicting an amount of power that would be used by said semiconductor device at said temperature and voltage values;
comparing said amount of power to a specified power limit; and
adjusting said target operating frequency if said amount of power exceeds said specified power limit, wherein otherwise said semiconductor device is operable at said target operating frequency.
6 Assignments
0 Petitions
Accused Products
Abstract
Methods and systems for operating a semiconductor device (e.g., a microprocessor) are described. The microprocessor is initially operated at a voltage and frequency that would be within operating limits at any device temperature. Using models that relate device temperature, operating limits and power consumption with voltage and frequency, the amount of supply voltage and a new operating frequency can be selected. The models are periodically consulted thereafter to continue adjusting the supply voltage and operating frequency, so that the microprocessor is caused to operate at very close to its capacity, in particular in those instances when, for example, processor-intensive instructions are being executed.
33 Citations
31 Claims
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1. A method comprising:
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accessing a temperature value corresponding to a temperature of a semiconductor device; selecting a target operating frequency; accessing a voltage value that corresponds to said temperature value and said target operating frequency; predicting an amount of power that would be used by said semiconductor device at said temperature and voltage values; comparing said amount of power to a specified power limit; and adjusting said target operating frequency if said amount of power exceeds said specified power limit, wherein otherwise said semiconductor device is operable at said target operating frequency. - View Dependent Claims (2, 3, 4, 5, 6, 28)
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7. A method comprising:
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selecting a target operating frequency; accessing a voltage value corresponding to said target operating frequency and to a temperature value, wherein said temperature value corresponds to a temperature of a semiconductor device; predicting an amount of power that would be used by said semiconductor device at said temperature and voltage values; comparing said amount of power to a specified power limit; and adjusting said target operating frequency according to a result of said comparing, wherein said target operating frequency is changed if said amount of power exceeds said specified power limit and otherwise said semiconductor device is operable at said target operating frequency and at a voltage corresponding to said voltage value. - View Dependent Claims (8, 9, 10, 11, 12, 29)
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13. A method comprising:
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accessing a temperature value corresponding to a temperature of a semiconductor device; accessing a voltage value that corresponds to said temperature value and to a target operating frequency; accessing a specified power limit; predicting an amount of power that would be used by said semiconductor device if said semiconductor device is operated at said temperature and voltage values; and adjusting said target operating frequency if said amount of power exceeds said specified power limit, wherein otherwise said semiconductor device is operable at said target operating frequency and at a voltage corresponding to said voltage value. - View Dependent Claims (14, 15, 16, 30)
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17. A method comprising:
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accessing a temperature value associated with a temperature of a semiconductor device; accessing a power limit that limits an amount of power that can be used by said semiconductor device; determining a ratio of a predicted operating life for said semiconductor device to a design operating life specified for said semiconductor device; selecting a voltage value that specifies a voltage to be supplied to said semiconductor device, wherein said voltage value is selected according to said temperature value, said power limit, and said ratio; predicting an amount of power that would be used by said semiconductor device at said temperature and voltage values; comparing said amount of power to a specified power limit; and adjusting an operating frequency of said semiconductor device according to a result of said comparing, wherein said operating frequency is changed if said amount of power exceeds said specified power limit and otherwise said semiconductor device is operable at said operating frequency and at a voltage corresponding to said voltage value. - View Dependent Claims (18, 19, 20, 21)
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22. A computer system comprising:
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memory; and a processor coupled to said memory, wherein said computer system is configured to perform operations comprising; accessing a temperature value corresponding to a temperature of a semiconductor device; selecting a target operating frequency; accessing a voltage value that corresponds to said temperature value and said target operating frequency; predicting an amount of power that would be used by said semiconductor device at said temperature and voltage values; comparing said amount of power to a specified power limit; and adjusting said target operating frequency if said amount of power exceeds said specified power limit, wherein otherwise said semiconductor device is operable at said target operating frequency. - View Dependent Claims (23, 24, 25, 26, 31)
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27. A system comprising:
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means for supplying an amount of voltage to a semiconductor device; means for measuring a temperature value of said semiconductor device; means for selecting a target operating frequency; means for predicting an amount of power that would be used by said semiconductor device at said temperature and voltage values; means for comparing said amount of power to a specified power limit; and means for adjusting an operating frequency of said semiconductor device according to a result of said comparing, wherein said operating frequency is changed if said amount of power exceeds said specified power limit and otherwise said semiconductor device is operable at said operating frequency and at a voltage corresponding to said voltage value.
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Specification