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Systems and methods for diagnosing faults in electronic systems

  • US 7,921,337 B2
  • Filed: 05/30/2008
  • Issued: 04/05/2011
  • Est. Priority Date: 05/30/2008
  • Status: Expired due to Fees
First Claim
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1. An apparatus for diagnosing a fault of a plurality of faults in an electronic system having a plurality of components based on one or more system inputs and system outputs of the electronic system, comprising:

  • a memory storing a model of the electronic system, the model configured to capture functional dependencies of the plurality of components, a causal flow in time of data transmitted between the plurality of components, or both;

    a processor coupled to the memory and configured to pass the one or more system inputs through the model to generate one or more simulated outputs; and

    a fault determination/isolation (FDI) module coupled to the processor and configured to be coupled to the electronic system, the FDI module configured to determine the fault based on a comparison of the one or more system outputs and the one or more simulated outputs.

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