Systems and methods for diagnosing faults in electronic systems

• US 7,921,337 B2
• Filed: 05/30/2008
• Issued: 04/05/2011
• Est. Priority Date: 05/30/2008
• Status: Expired due to Fees

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: McCroskey, Robert C., Mylaraswamy, Dinkar
• Primary Examiner(s): LE, DIEU MINH T
• Application Number:
  US12/130,478
• Publication Number:
  US 20090300429A1
• Time in Patent Office: 1,040 Days
• Field of Search: 714/48, 714/47, 714/37, 714/39, 714/44, 714/25, 714/4
• US Class Current: 714/48
• CPC Class Codes: G05B 23/0254 based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks
• CPC Class Codes: G06F 11/0739 in a data processing system embedded in automotive or aircraft systems
• CPC Class Codes: G06F 11/079 Root cause analysis, i.e. error or fault diagnosis in a hardware test environment G06F11/22; in a software test environment G06F11/36
• CPC Class Codes: G06F 11/261 by simulating additional hardware, e.g. fault simulation

Abstract

Apparatus, systems, and methods for identifying a fault in an electronic system are provided. One apparatus includes memory storing a model of the electronic system, a processor, and a fault module. The processor is configured to pass system inputs through the model to generate corresponding simulated outputs, and the fault module is configured to determine the fault based on a comparison of the system outputs and the simulated outputs. A system includes an electronic system including multiple components generating system outputs based on system inputs and the apparatus for identifying a fault in the electronic system discussed above. One method includes generating a model of the electronic system, passing one or more inputs to the electronic system through the model to generate corresponding simulated outputs, and determining the fault based on a comparison of the one or more simulated outputs and one or more electronic system outputs.

Claims

1. An apparatus for diagnosing a fault of a plurality of faults in an electronic system having a plurality of components based on one or more system inputs and system outputs of the electronic system, comprising:

a memory storing a model of the electronic system, the model configured to capture functional dependencies of the plurality of components, a causal flow in time of data transmitted between the plurality of components, or both;

a processor coupled to the memory and configured to pass the one or more system inputs through the model to generate one or more simulated outputs; and

a fault determination/isolation (FDI) module coupled to the processor and configured to be coupled to the electronic system, the FDI module configured to determine the fault based on a comparison of the one or more system outputs and the one or more simulated outputs.

2. The apparatus of claim 1, wherein the FDI module is further configured to identify a cause of the fault based on the comparison.

3. The apparatus of claim 2, wherein the memory further stores one or more fault signatures, each fault signature configured to modify one or more parameters in the model.

4. The apparatus of claim 2, wherein the FDI module is further configured to compare the one or more system outputs and the one or more simulated outputs in determining the fault.

5. The apparatus of claim 4, wherein the FDI module is configured to identify the fault as a fault signature associated with a parameter that results in a simulated output that matches the one or more system outputs.

6. The apparatus of claim 5, wherein the FDI module is further configured to identify a faulty one of the plurality of components based on the associated fault.

7. The apparatus of claim 1, wherein the FDI module is further configured to determine a magnitude of the fault.

8. A system for diagnosing an electronic system fault, comprising:

an electronic system including a plurality of components generating one or more system outputs based on system inputs;

memory storing a model of the electronic system, the model configured to capture functional dependencies of the plurality of components, a causal flow in time of data transmitted between the plurality of components, or both;

a processor coupled to the memory and configured to pass the one or more system inputs through the model to generate one or more simulated outputs; and

a fault determination/isolation (FDI) module coupled to the processor and the electronic system, the FDI module configured to determine the fault based on a comparison of the one or more system outputs and the one or more simulated outputs.

9. The system of claim 8, wherein the FDI module is further configured to recognize an error in the electronic system based on the one or more system outputs.

10. The system of claim 8, wherein the memory further stores one or more fault signatures, each fault signature configured to modify a parameter in the model.

11. The system of claim 10, wherein the FDI module is further configured to compare the one or more system outputs and the one or more simulated outputs in determining the fault.

12. The system of claim 8, wherein the FDI module is further configured to determine a magnitude of the fault.

13. A method for identifying a fault of a plurality of faults in an electronic system including a plurality of components, comprising the steps of:

generating a model of the electronic system, the model capturing functional dependencies of the plurality of components, a causal flow in time of data transmitted between the plurality of components, or both;

passing one or more inputs that are supplied to the electronic system through the model to generate one or more simulated outputs; and

determining the fault based on a comparison of the one or more simulated outputs and one or more outputs of the electronic system.

14. The method of claim 13, further comprising the step of determining a cause of the fault based on the comparison.

15. The method of claim 14, further comprising the step of comparing the one or more system outputs and the one or more simulated outputs in determining the fault.

16. The method of claim 15, further comprising the step of identifying the fault as a fault associated with a parameter that results in a simulated output that matches the one or more system outputs.

17. The method of claim 16, further comprising the step of identifying a faulty one of the plurality of components based on the associated fault.

18. The method of claim 13, further comprising the step of determining a magnitude of the fault.