Systems and methods for diagnosing faults in electronic systems
First Claim
1. An apparatus for diagnosing a fault of a plurality of faults in an electronic system having a plurality of components based on one or more system inputs and system outputs of the electronic system, comprising:
- a memory storing a model of the electronic system, the model configured to capture functional dependencies of the plurality of components, a causal flow in time of data transmitted between the plurality of components, or both;
a processor coupled to the memory and configured to pass the one or more system inputs through the model to generate one or more simulated outputs; and
a fault determination/isolation (FDI) module coupled to the processor and configured to be coupled to the electronic system, the FDI module configured to determine the fault based on a comparison of the one or more system outputs and the one or more simulated outputs.
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Abstract
Apparatus, systems, and methods for identifying a fault in an electronic system are provided. One apparatus includes memory storing a model of the electronic system, a processor, and a fault module. The processor is configured to pass system inputs through the model to generate corresponding simulated outputs, and the fault module is configured to determine the fault based on a comparison of the system outputs and the simulated outputs. A system includes an electronic system including multiple components generating system outputs based on system inputs and the apparatus for identifying a fault in the electronic system discussed above. One method includes generating a model of the electronic system, passing one or more inputs to the electronic system through the model to generate corresponding simulated outputs, and determining the fault based on a comparison of the one or more simulated outputs and one or more electronic system outputs.
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Citations
18 Claims
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1. An apparatus for diagnosing a fault of a plurality of faults in an electronic system having a plurality of components based on one or more system inputs and system outputs of the electronic system, comprising:
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a memory storing a model of the electronic system, the model configured to capture functional dependencies of the plurality of components, a causal flow in time of data transmitted between the plurality of components, or both; a processor coupled to the memory and configured to pass the one or more system inputs through the model to generate one or more simulated outputs; and a fault determination/isolation (FDI) module coupled to the processor and configured to be coupled to the electronic system, the FDI module configured to determine the fault based on a comparison of the one or more system outputs and the one or more simulated outputs. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A system for diagnosing an electronic system fault, comprising:
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an electronic system including a plurality of components generating one or more system outputs based on system inputs; memory storing a model of the electronic system, the model configured to capture functional dependencies of the plurality of components, a causal flow in time of data transmitted between the plurality of components, or both; a processor coupled to the memory and configured to pass the one or more system inputs through the model to generate one or more simulated outputs; and a fault determination/isolation (FDI) module coupled to the processor and the electronic system, the FDI module configured to determine the fault based on a comparison of the one or more system outputs and the one or more simulated outputs. - View Dependent Claims (9, 10, 11, 12)
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13. A method for identifying a fault of a plurality of faults in an electronic system including a plurality of components, comprising the steps of:
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generating a model of the electronic system, the model capturing functional dependencies of the plurality of components, a causal flow in time of data transmitted between the plurality of components, or both; passing one or more inputs that are supplied to the electronic system through the model to generate one or more simulated outputs; and determining the fault based on a comparison of the one or more simulated outputs and one or more outputs of the electronic system. - View Dependent Claims (14, 15, 16, 17, 18)
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Specification