Self-cleaning adhesive structure and methods

• US 7,921,858 B2
• Filed: 03/29/2010
• Issued: 04/12/2011
• Est. Priority Date: 01/05/2004
• Status: Active Grant

• Current Assignee: Lewis & Clark College
• Original Assignee: Lewis & Clark College
• Inventors: Hansen, Wendy R., Autumn, Kellar
• Primary Examiner(s): Kornakov; Michael
• Assistant Examiner(s): Golightly; Eric
• Application Number:
  US12/749,398
• Publication Number:
  US 20100204830A1
• Time in Patent Office: 379 Days
• Field of Search: None
• US Class Current: 134/137
• CPC Class Codes: B08B 17/06 by giving articles subject to fouling a special shape or arrangement
• CPC Class Codes: B08B 7/0028 by adhesive surfaces
• CPC Class Codes: B25J 7/00 Micromanipulators specimen supports for investigating or analysing materials G01N23/2204; associated with microscopes G02B21/32; means for supporting or positioning the objects or the material in discharge tubes H01J37/20
• CPC Class Codes: B81B 3/0062 Devices moving in two or more dimensions, i.e. having special features which allow movement in more than one dimension
• CPC Class Codes: B81C 99/002 Apparatus for assembling MEMS, e.g. micromanipulators micromanipulators per se B25J7/00

Abstract

An apparatus for transporting an object from one workstation to another, where the object or workstations may be contaminated with unwanted dirt or dust particles. A movable transfer arm connected to a control unit has an end effector including an array of nano-scale projections, where each projection provides one or more distal contact ends. The density of the contact ends is such as to grip a surface of the object with an intermolecular force sufficient to hold the object for movement in accordance with a control unit program. In accordance with a control unit program, after moving the gripped object to the workstation, the end effector is manipulated to release the gripped object, and before, during or after transport of the object, bring the arm'"'"'s end effector into contact with a cleaning surface.

Claims

1. Apparatus for transporting an object from one workstation to another, or for manipulating an object within a workstation, where the object or workstations may be contaminated with unwanted dirt or dust particles, said apparatus comprising:

(a) a movable transfer arm having an end effector composed of an array of nano-scale projections, where each projection provides one or more distal contact ends, the density of contact ends is such as to grip a surface of the object with an intermolecular force sufficient to hold the object for movement, and the relative sizes of the object and particles are such that the object makes contact with severalfold times of the number of contact ends than contacts such particles,

(b) a cleaning surface disposed within the area of movement of the transfer arm, said surface having a surface energy interaction with particles carried on said end effector as great or greater than the surface energy interaction between particles and effector, and

(c) a control unit operatively connected to said arm and programmed to;

(i) place said end effector in contact with such an object at one workstation thereby to grip the object,

(ii) move the arm and gripped object within the workstation or to another workstation;

(iii) manipulate said end effector to release the gripped object, and

(iv) bring said end effector into contact with the cleaning surface one or more times, to transfer unwanted dust particles on the gripping surface to the cleaning surface.

2. The apparatus of claim 1, wherein said projections are individual or groups of setae, each seta composed of a setal stalk terminating at a distal tip, and said setae are sufficiently flexible to adapt said array for non-planar contact with said object.

3. The apparatus of claim 2 wherein said setal stalks have a Young'"'"'s modulus of 1 megaPascal or greater, and said distal tips have a hydrophobicity, as measured by surface energy, of between 10-40 mJ/m².

4. The apparatus of claim 3, wherein said setae terminate at enlarged, rounded contact ends.

5. The apparatus of claim 1, wherein each of said projections includes individual or groups of spatular arrays, where each spatula is composed of a spatular stalk terminating at a distal contact ends, and said spatulae are sufficiently flexible to adapt said array for non-planar contact with said object.

6. The apparatus of claim 5, wherein said spatular stalks have a Young'"'"'s modulus of 1 megaPascal or greater, and said distal tips have a hydrophobicity, as measured by a surface energy, of between 10-40 mJ/m².

7. The apparatus of claim 6, wherein said spatulae terminate at enlarged, rounded ends.

8. The apparatus of claim 1, wherein said cleaning surface provides a greater area of contact with the unwanted particles than the end effector.

9. The apparatus of claim 8, wherein the cleaning surface has a surface roughness of less than about 100 nm R_RMS.

10. The apparatus of claim 9, for use in transporting an object having a contact area A_o which is in a defined size range greater than about 5,000 nm², and for self-cleaning unwanted particles having a contact area A_p in a defined size range between about 100 and 6400 nm², and less than about 0.1A₀, wherein said projections terminate at a hemispherical distal tip having a selected radial dimension R between about 5 and 2,000 nm, and where:

(i) A_p,≧

2 π

nm×

R,

(ii) the spacing between adjacent projections is such that an unwanted particle makes contact on average with several fold times fewer projections than does the object; and

(iii) the projections are formed of a material having a surface energy of between about 10-40 mJ/m².

11. The apparatus of claim 10, wherein the radial dimension R and corresponding areal dimensions A, and A, are selected from the group consisting of:

(i) when R≧

5 nm, A_p,≧

80 nm², and A_o≧

800 nm²;

(ii) when R≧

25 nm, A_p,≧

200 nm², and A_o,≧

2,000 nm²;

(iii) when R≧

50 nm, A_p,≧

400 nm², and A_o≧

4,000 nm²;

(iv) when R≧

100 nm, A_p,≧

650 nm², and A_o,≧

6,500 nm²;

(v) when R≧

250 nm, A_p,≧

1,600 nm², and A_o,≧

16,000 nm²;

(vi) when R≧

500 nm, A_p,≧

3,200 nm², and A_o≧

32,000 nm²;

(vii) when R≧

1,000 nm, A_p,≧

6,300 nm², and A_o,≧

63,000 nm²;

(viii) when R≧

1,500 nm, A_p,≧

9,500 nm², and A_o,≧

95,000 nm²; and

(ix) when R≧

2,000 nm, A_p,≧

12,600 nm², and A_o,≧

126,000 nm².

12. The apparatus of claim 11, wherein the peak to peak spacing between adjacent projections is greater than R.

13. The apparatus of claim 1, wherein said control unit is programmed to operate to carry out operation (iv) by bringing the arm'"'"'s gripping surface into and out of contact with the cleaning surface N times, where N is calculated to effect transfer of a particle from the arm'"'"'s gripping surface to the cleaning surface.

14. The apparatus of claim 13, wherein said control unit is programmed to operate to carry out operation (iv) by vibrating the arm'"'"'s gripping surface into and out of contact with the cleaning surface for a selected time which is calculated to effect transfer of a particle from the arm'"'"'s gripping surface to the cleaning surface.

15. The apparatus of claim 1, wherein said control unit is programmed to operate to carry out operation (iii) by (iiia) placing the object on said other workstation and (iiib) rotating the end effector to peel the object away from the arm'"'"'s gripping surface.