Scatter attenuation tomography

• US 7,924,979 B2
• Filed: 09/01/2009
• Issued: 04/12/2011
• Est. Priority Date: 08/23/2006
• Status: Expired due to Fees

• Current Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Original Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Inventors: Rothschild, Peter J.
• Primary Examiner(s): Kao; Chih-Cheng G
• Application Number:
  US12/551,972
• Publication Number:
  US 20100034347A1
• Time in Patent Office: 588 Days
• Field of Search: 378/86, 378/87, 378/88, 378/89
• US Class Current: 378/88
• CPC Class Codes: G01V 5/222 measuring scattered radiation
• CPC Class Codes: G01V 5/224 Multiple energy techniques using one type of radiation, e.g. X-rays of different energies

Abstract

A system and methods for characterizing an inspected object on the basis of attenuation determined from pair-wise illuminated voxels. A beam of penetrating radiation characterized by a propagation direction and an energy distribution is scanned relative to an object, while scatter detectors with collimated fields-of-view detect radiation scattered by each voxel of the inspected object that is intercepted by the incident beam of penetrating radiation. By calculating the attenuation of penetrating radiation between pairs of voxels illuminated sequentially by the incident beam, a tomographic image is obtained characterizing the three-dimensional distribution of attenuation in the object of one or more energies of penetrating radiation, and thus of various material characteristics.

Claims

1. An x-ray inspection system for characterizing an object on a basis of a measure of attenuation substantially transverse to an incident beam, the x-ray inspection system comprising:

a source for generating an incident beam of penetrating radiation, the incident beam characterized by a propagation direction and an energy distribution;

a plurality of detector elements disposed about the beam of penetrating radiation, each detector element characterized by a field of view, each detector element generating a detector signal;

a processor input adapted to receive a first detector signal characterizing radiation scattered from a first voxel, and to receive a second detector signal characterizing radiation scattered from a second voxel; and

a processor adapted to determine material composition based upon a calculated attenuation of scattered penetrating radiation, in a direction substantially transverse to the incident beam of penetrating radiation, between the first voxel and the second voxel.

2. An x-ray inspection system in accordance with claim 1, further comprising a conveyor for moving the object relative to the incident beam.

3. An x-ray inspection system in accordance with claim 1, further comprising a beam steerer for varying an orientation of the incident beam relative to the object.

4. An x-ray inspection system in accordance with claim 3, wherein the beam steerer includes a moving shutter.

5. An x-ray inspection system in accordance with claim 1, wherein the plurality of detector elements are disposed distally to the object with respect to the incident beam.

6. An x-ray inspection system in accordance with claim 1, wherein the plurality of detector elements are disposed proximally to the object with respect to the incident beam.

7. An x-ray inspection system in accordance with claim 1, wherein at least one of the plurality of detector elements is disposed to a side of the object with respect to the incident beam.

8. An x-ray inspection system in accordance with claim 1, wherein the plurality of detector elements are collimated.

9. An x-ray inspection system in accordance with claim 1, wherein the plurality of detector elements are characterized by fields of view capable of being steered independently relative to the object.

10. An x-ray inspection system in accordance with claim 1, wherein each of the source and the plurality of detector elements may be rotated about an axis relative to the object.

11. An x-ray inspection system in accordance with claim 1, wherein the incident beam is a pencil beam.

12. An x-ray inspection system in accordance with claim 1, wherein the incident beam is a fan beam.

13. An x-ray inspection system in accordance with claim 1, wherein the plurality of detector elements are energy-selective.

14. An x-ray inspection system in accordance with claim 1, wherein the energy distribution of the incident beam of penetrating radiation is varied temporally.

15. A method for characterizing an object on a basis of a measure of attenuation substantially transverse to an incident beam, the method comprising:

generating an incident beam of penetrating radiation, the incident beam characterized by a propagation direction and an energy distribution;

detecting radiation scattered by a first pair of distinct voxels illuminated by the incident beam;

detecting radiation scattered by a second pair of distinct voxels illuminated by the incident beam;

receiving a first detector signal characterizing radiation scattered from a first voxel and a second detector signal characterizing radiation scattered from a second voxel of each of the first and second pairs of voxels; and

determining material composition based upon a calculated attenuation of scattered penetrating radiation, in a direction substantially transverse to the incident beam of penetrating radiation, between the first voxel and the second voxel of each pair of voxels.

16. A method in accordance with claim 15, further comprising moving the object relative to the incident beam.

17. A method in accordance with claim 15, further comprising varying an orientation of the incident beam relative to the object.

18. A method in accordance with claim 15, further comprising steering the plurality of detector elements independently relative to the object.

19. A method in accordance with claim 15, further comprising rotating a source generating the incident beam and a plurality of detector elements detecting the scattered radiation relative to the object.

20. A method in accordance with claim 15, further comprising temporally varying energy characteristics of the incident beam.