Mini environment apparatus, inspection apparatus, manufacturing apparatus and cleaning method of space
First Claim
Patent Images
1. An inspection apparatus for detecting a defect on a substrate, comprising:
- a first casing having a first fan-filter-unit;
a second casing having a second fan-filter-unit, the second casing is smaller than the first casing and being adjacent to the first casing;
a clean chamber which is defined by a part of wall of the first casing and the second casing;
a shutter arranged on the wall of the first casing to communicate with the clean chamber;
a third casing having a third fan-filter-unit and surrounding the second casing;
a pod for accommodating the substrate;
a carrier apparatus for carrying the substrate from the pod to the clean chamber and being arranged in the first casing;
an optical type inspection apparatus for inspecting a defect on the substrate and being arranged in the clean chamber;
a first pressure measuring unit for measuring a first pressure in an external environment;
a second pressure measuring unit for measuring a second pressure within the first casing;
a third pressure measuring unit for measuring a third pressure within the clean chamber;
a fourth pressure measuring unit for measuring a fourth pressure within the third casing; and
a control unit for controlling the first, second and third fan-filter-units based on the first, second and third pressures.
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Abstract
An outer dust collecting filter covers a casing an intake port and an outer fan flows air from an external environment into the casing via the outer dust collecting filter. A clean chamber has an intake port within the casing, an inner dust collecting filter for covering the intake port, and an inner fan for flowing the air within the casing. A control unit controls fan rotating speeds so that a measured pressure within the casing becomes higher at a set value than a measured pressure in the external environment, and a measured pressure within the clean chamber becomes higher at a set value than the measured pressure within the casing.
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Citations
1 Claim
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1. An inspection apparatus for detecting a defect on a substrate, comprising:
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a first casing having a first fan-filter-unit; a second casing having a second fan-filter-unit, the second casing is smaller than the first casing and being adjacent to the first casing; a clean chamber which is defined by a part of wall of the first casing and the second casing; a shutter arranged on the wall of the first casing to communicate with the clean chamber; a third casing having a third fan-filter-unit and surrounding the second casing; a pod for accommodating the substrate; a carrier apparatus for carrying the substrate from the pod to the clean chamber and being arranged in the first casing; an optical type inspection apparatus for inspecting a defect on the substrate and being arranged in the clean chamber; a first pressure measuring unit for measuring a first pressure in an external environment; a second pressure measuring unit for measuring a second pressure within the first casing; a third pressure measuring unit for measuring a third pressure within the clean chamber; a fourth pressure measuring unit for measuring a fourth pressure within the third casing; and a control unit for controlling the first, second and third fan-filter-units based on the first, second and third pressures.
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Specification