×

Electrical overstress and transient latch-up pulse generation system, circuit, and method

  • US 7,928,737 B2
  • Filed: 05/23/2008
  • Issued: 04/19/2011
  • Est. Priority Date: 05/23/2008
  • Status: Expired due to Fees
First Claim
Patent Images

1. A method of testing a device of the type that includes a plurality of pins with a system comprising a pulse generation circuit, a relay pin matrix, an oscilloscope, and a controller, wherein the pulse generation circuit is electrically coupled with the relay pin matrix, oscilloscope, and controller, and wherein the controller is electrically coupled with the relay pin matrix and oscilloscope, the method comprising:

  • programmatically controlling the relay pin matrix with the controller to relay a signal from the pulse generation circuit to at least one pin from among the plurality of pins of the device;

    producing a triggering signal with the controller;

    transforming the triggering signal into a test signal and a ratio signal with the pulse generation circuit, wherein the test signal is operable to test at least one of a transient induced latch-up or an electrical overstress characteristic of the device, transforming the triggering signal into the test signal and the ratio signal further comprising;

    converting the triggering signal with an analog-to-digital converter,receiving the converted triggering signal at the pulse generation circuit,transforming the triggering signal into an inverted signal with an inverting operational amplifier having a unity gain in the pulse generation circuit,transforming the inverted signal into the test signal with the power amplifier electrically coupled with the inverting operational amplifier, wherein the test signal is the signal relayed to the at least one pin of the device, andtransforming the test signal into the ratio signal with a ratio circuit electrically coupled with the power amplifier in the pulse generation circuit, wherein the ratio signal is such that the magnitude of the voltage of the ratio signal substantially corresponds to the magnitude of the current of the test signal;

    measuring the test signal and the ratio signal with the oscilloscope during the testing;

    in response to relaying the test signal to at least one pin of the device and measuring the ratio signal, determining at least one of the transient induced latch-up or electrical overstress characteristic of the device.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×