Optical apparatus

• US 7,929,137 B2
• Filed: 09/08/2009
• Issued: 04/19/2011
• Est. Priority Date: 01/31/1997
• Status: Expired due to Fees

• Current Assignee: XY, LLC (Inguran LLC)
• Original Assignee: XY, LLC (Inguran LLC)
• Inventors: Scharpe, Jonathan C., Schaare, Peter N.
• Primary Examiner(s): Toatley; Gregory J
• Assistant Examiner(s): Merlino; Amanda H
• Application Number:
  US12/555,641
• Publication Number:
  US 20100007880A1
• Time in Patent Office: 588 Days
• Field of Search: None
• US Class Current: 356/338
• CPC Class Codes: G01N 15/1434 Optical arrangements
• CPC Class Codes: G01N 15/1436 the optical arrangement forming an integrated apparatus with the sample container, e.g. a flow cell
• CPC Class Codes: G01N 15/1459 the analysis being performed on a sample stream
• CPC Class Codes: G01N 15/149 specially adapted for sorting particles, e.g. by their size or optical properties
• CPC Class Codes: G01N 2015/1452 Adjustment of focus; Alignment
• CPC Class Codes: G01N 2021/6469 Cavity, e.g. ellipsoid
• CPC Class Codes: G01N 21/49 within a body or fluid
• CPC Class Codes: G02B 5/04 Prisms

Abstract

Various optical apparatus, in particular embodiments, may provide a source of parallel light (7, 75). The parallel light (7, 75) may be generally achieved by directing an incident beam at the apex of a prism (1, 22, 24, 26, 28). The prism may have varying configurations. One configuration has a forward conical face (24). Another configuration has a pyramidal forward end (22). Other configurations are also disclosed. Various optical methods and methods for flow cytometry are also disclosed.

Claims

1. An analyzation instrument, comprising:

a) a flow source to produce a flow of particles through an inspection zone;

b) a source of electromagnetic radiation adapted to direct electromagnetic radiation onto said flow of particles at said inspection zone;

c) a partial ellipsoidal collector having a near focal point at said inspection zone and a distant focal point which define an optical axis along a line between said near focal point and said distant focal point, said flow of particles substantially aligned with said optical axis, said electromagnetic radiation either produced or deflected from said flow of particles reflected from said partial ellipsoidal collector converges towards said distant focal point; and

d) a sensor which senses said electromagnetic radiation which converges towards said distant focal point;

e) a processor which processes sensed electromagnetic radiation to derive predetermined information of particles; and

f) a sorting apparatus to sort said particles based on said predetermined information downstream of said flow source.

2. The analyzation instrument of claim 1, further comprising a correlator to correlate said predetermined information with one of said particles downstream of said flow source.

3. The analyzation instrument of claim 2, further comprising a partial ellipsoidal reflector having a near focal point at said source of said electromagnetic radiation, said reflector oriented in relation to said partial ellipsoidal collector to allow said collector to reflect said electromagnetic radiation onto said flow of particles.

4. The analyzation instrument of claim 3, wherein a distant focal point of said partial ellipsoidal reflector and said distant focal point of said partial ellipsoidal collector overlap.

5. The analyzation instrument of claim 4, wherein said distant focal length of said partial ellipsoidal reflector is greater than said distant focal length of said partial ellipsoidal collector.

6. The analyzation instrument of claim 5 further comprising an aperture in said partial ellipsoidal collector for outward passage of said flow of particles.

7. The analyzation instrument of claim 6, further comprising a filter to filter out a portion of the electromagnetic radiation emitted by said source of electromagnetic radiation.

8. The analyzation instrument of claim 6, wherein said source of electromagnetic radiation comprises an arc lamp.

9. A method of analyzing, comprising the steps of:

a) passing a flow of particles to be analyzed through an inspection zone;

b) reflecting electromagnetic radiation from a partial ellipsoidal collector to a near focal point at said inspection zone to deliver electromagnetic radiation onto said flow of particles;

c) collecting said electromagnetic radiation either produced or deflected from said flow of particles with said partial ellipsoidal collector having near focal point at said inspection zone and a distant focal point which define an optical axis said flow of particles substantially aligned with said optical axis;

d) directing said electromagnetic radiation either produced or deflected from said flow of particles to converge towards said distant focal point with said partial ellipsoidal collector;

e) sensing said electromagnetic radiation directed towards said distant focal point;

f) processing to derive from said electromagnetic radiation sensed predetermined information of particles in said flow; and

g) sorting said particles based on said predetermined information.

10. The method of claim 9, further comprising the step of correlating said predetermined information with said flow of particles.

11. The method of claim 9, wherein said step of delivering electromagnetic radiation onto said flow of particles at said inspection zone further comprises the step of reflecting said electromagnetic radiation from said partial ellipsoidal collector to said near focal point at said inspection zone.

12. The method of claim 11, further comprising the step of providing an opening in said partial ellipsoidal collector for outward passage of said flow of particles.

13. The method of claim 12, further comprising the step of providing a partial ellipsoidal reflector having a near focal point at a source of said electromagnetic radiation, said partial ellipsoidal reflector oriented in relation to said collector to direct said electromagnetic radiation onto said partial ellipsoidal collector to allow said partial ellipsoidal collector to reflect said electromagnetic radiation onto said flow of particles.

14. The method of claim 13, further comprising the step overlapping said distant focal point of said partial ellipsoidal reflector and said distant focal point of said partial ellipsoidal collector.

15. The method of claim 14, wherein said distant focal length of said partial ellipsoidal reflector is greater than said distant focal length of said partially ellipsoidal collector.

16. The method of claim 15, further comprising the step of filtering out a portion of said electromagnetic radiation emitted by said source of electromagnetic radiation.

17. The method of claim 16, further comprising the step of emitting said electromagnetic radiation from an arc lamp.