Spherical calibration and reference alignment algorithms

• US 7,930,148 B1
• Filed: 10/14/2008
• Issued: 04/19/2011
• Est. Priority Date: 08/20/2007
• Status: Expired due to Fees

• Current Assignee: PNI Corporation (PNI Digital Media)
• Original Assignee: PNI Sensor Corporation
• Inventors: Figaro, Davy, Boeen, Anders, Bryant, Tyler
• Primary Examiner(s): Bui; Bryan
• Application Number:
  US12/251,338
• Time in Patent Office: 917 Days
• Field of Search: 702/154, 702/196, 333/12, 333/13
• US Class Current: 702/196
• CPC Class Codes: E21B 47/022 of the borehole, e.g. using geomagnetism
• CPC Class Codes: G01C 17/38 Testing, calibrating, or compensating of compasses
• CPC Class Codes: G01C 25/005 initial alignment, calibration or starting-up of inertial devices

Abstract

Inclinometer and directional field sensor readings can have gain, offset, and non-orthogonality errors, as well as reference alignment rotation errors. When a series of readings are taken by a three axis sensor with a variety of different orientations, the resulting dataset looks like a perfect hypothetical sphere in the absence of any errors; with errors as mentioned above the dataset looks like an offset, rotated, ellipsoidal quadratic surface. This invention provides a simple method of removing the above errors from a tilt reference device. A disclosed algorithm is divided into two distinct components: the ellipsoidal quadratic surface component, which covers gain, offset, and axis misalignment; and the rotation component, which covers rotation relative to a set of reference axes. The solution presented here addresses both components combined, or separated and for inclinometers, magnetometers and rate sensors.

Claims

1. A method for performing a spherical calibration on acquired directional field sensor data to correct directional field sensor measurement errors arising from cross axis gain and offset errors to within a preset limit comprising the steps:

acquiring directional field sensor data in at least two axes comprising at least four different tilt angles;

determining a set of coefficients from a best fit calculation;

determining a symmetric matrix from the set of coefficients;

solving for a transform matrix;

solving for an offset matrix; and

correcting the acquired directional field sensor data with the transform matrix and the offset matrix such that the corrected directional field sensor data is within the preset limit of the true field being measured.

2. A method for performing a spherical calibration as in claim 1 wherein directional field sensor data in at least two axes comprising at least six different tilt angles is acquired.

3. A method for performing a spherical calibration as in claim 1 wherein directional field sensor data in at least two axes comprising at least nine different tilt angles is acquired.

4. A method for performing a spherical calibration as in claim 1 wherein said directional field sensor data is acquired by an inclinometer.

5. A method for performing a spherical calibration as in claim 1 wherein said directional field sensor data is acquired by a magnetometer.

6. A method to determine misalignment between a device reference frame and a physical reference frame comprising the steps:

making a first measurement, Mdevref, with a device in a first physical reference orientation (8110);

rotating the device a first angle, phi1, from the first physical reference orientation around a first physical reference frame axis, Vphys1;

making a second measurement, Mdev1;

rotating the device a second angle, phi2, from the first physical reference orientation around second physical reference frame axis Vphys2;

making a third measurement, Mdev2;

applying an algorithm to estimate the rotation required to align the device frame to the physical reference frame using the known angles phi1, phi2 and the matching physical axes Vphys1, Vphys2; and

outputting a rotation matrix, TRref.

7. The method of claim 6 comprising, after said applying and before said outputting, the additional steps:

calculating a residual error;

determining whether residual error is less than a preset limit.

8. The method of claim 6 comprising the additional steps after said making a third measurement, Mdev2

rotating the device a third angle phi3 from the first physical reference orientation around third physical frame axis Vphys3;

and

making a fourth measurement Mdev3 in this fourth physical orientation.

9. The method of claim 8 comprising the additional steps after said making a fourth measurement, Mdev3:

rotating at least one additional angle phi4 from the first physical reference orientation around at least one additional physical frame axis Vphys4; and

making at least one additional measurements Mdev4.

10. A method to adjust misalignment between a device reference frame and a physical reference frame defined by Urot1_df and Urot2_df to below a preset limit comprising the steps:

making at least three first sensor field measurements while rotating the device reference frame around a first axis Urot1_ef, wherein Urot1_ef coincides with a physical reference frame axis Rphys1Z_ef;

rotating the device reference frame a first angle around a second physical reference frame axis Rphys2X_ef;

making at least three second sensor field measurements while rotating the device reference frame around a second axis Urot2_ef, wherein Urot2_ef does not coincide with physical reference frame axis Rphys2Z_ef; and

processing the at least three first and the at least three second measurements to obtain a rotation matrix Tr such that Tr rotates the device reference frame to align with the physical reference frame defined by Urot1_df and Urot2_df such that residual errors between the device reference frame and the physical reference frame after rotation by Tr are below a preset limit.

11. The method of claim 10 comprising the further steps of:

processing said at least three first and the at least three second measurements such that vectors Urot1_df and Urot2_df are defined in the device frame; and

obtaining a rotation matrix Tr such that the device reference frame is aligned with the physical reference frame defined by Urot1_df and Urot2_df such that the residual errors between the device frame and the physical frame are below the preset limit.

12. The method of claim 10 wherein said at least three first and said at least three second sensor field measurements comprise at least one of magnetic and one from an inclinometer.

13. The method of claim 10 wherein said at least three first and said at least three second sensor field measurements comprise measurements from a magnetometer with at least two sensing axes.

14. The method of claim 10 wherein said at least three first and said at least three second sensor field measurements comprise measurements from an inclinometer with at least two sensing axes.

15. An apparatus for sensing orientation and heading with residual errors below a preset limit comprising:

a first sensor comprising at least two sensing axes;

a second sensor comprising at least two sensing axes; and

an algorithm for performing a spherical calibration on acquired first and second sensor data to correct sensor measurement errors arising from cross axis, gain, and offset errors wherein first and second sensor data is acquired in at least two axes comprising at least four different tilt angles such that an offset matrix and a transform matrix is calculated such that the residual errors of the corrected sensor measurements are below the preset limits of the true first and second sensor readings being measured.

16. The apparatus of claim 15 wherein said first sensor is a magnetometer and said second sensor is an inclinometer.

17. The apparatus of claim 15 wherein said first sensor is a rate sensor.

18. The apparatus of claim 15 wherein the first sensor and the second sensor are inclinometers.

19. An apparatus for sensing orientation and heading comprising:

a first sensor comprising at least two sensing axes;

a second sensor comprising at least two sensing axes; and

an algorithm for determining misalignment between a device reference frame and a physical reference frame wherein a series of at least three measurements by both the first and second sensors are made interspersed by at least two rotations about at least two different axes of each first and second sensors such that wherein a rotation matrix, TRref is calculated.

20. The apparatus of claim 19 wherein said first sensor is a magnetometer and said second sensor is an inclinometer.

21. The apparatus of claim 19 wherein said first sensor and said second sensor are inclinometers.

22. The apparatus of claim 19 wherein at least one of said first sensor and said second sensor are a rate sensor.