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Contact microscope using point source illumination

  • US 7,936,501 B2
  • Filed: 03/31/2008
  • Issued: 05/03/2011
  • Est. Priority Date: 04/20/2007
  • Status: Expired due to Fees
First Claim
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1. A contact microscope, comprising:

  • at least one point light source positioned above a specimen supporting region; and

    an imager that contacts and underlies said specimen supporting region, said imager comprising;

    a glass plate that forms a top surface of said imager, wherein a portion of said top surface of said glass plate comprises said specimen supporting region;

    a Complementary Metal Oxide Semiconductor (CMOS) imager die located beneath said glass plate, wherein said CMOS imager die receives an optical image of said specimen that does not pass through an optical lens; and

    a circuit board, which lies beneath said CMOS imager die,said specimen supporting region intersects a unidirectional path of light from said at least one point light source to said CMOS imager die.

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