Adaptive power control

• US 7,941,675 B2
• Filed: 12/31/2002
• Issued: 05/10/2011
• Est. Priority Date: 12/31/2002
• Status: Expired due to Term

• Current Assignee: Meta Platforms, Inc. (f/k/a Facebook, Inc.)
• Original Assignee: Intellectual Ventures Funding LLC (Intellectual Ventures LLC)
• Inventors: Stewart, Tom, Burr, James B., Read, Andrew
• Primary Examiner(s): Lee; Thomas
• Assistant Examiner(s): Rahman; Fahmida
• Application Number:
  US10/334,918
• Publication Number:
  US 20040128566A1
• Time in Patent Office: 3,052 Days
• Field of Search: 713/300, 713/310, 713/330, 713/340, 713320-324, 702/57, 702/60, 702 64- 65
• US Class Current: 713/300
• CPC Class Codes: G06F 1/3203 Power management, i.e. event-based initiation of a power-saving mode
• CPC Class Codes: G06F 1/324 by lowering clock frequency
• CPC Class Codes: G06F 1/3296 by lowering the supply or operating voltage
• CPC Class Codes: Y02D 10/00 Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

A method and system of adaptive power control. Characteristics of a specific integrated circuit are used to adaptively control power of the integrated circuit.

Claims

1. A method comprising:

accessing a measurement of a frequency-voltage characteristic specific to an individual integrated circuit of a plurality of integrated circuits;

associating the frequency-voltage characteristic with the individual integrated circuit of the plurality of integrated circuits; and

operating the individual integrated circuit at a voltage and frequency specified by the frequency-voltage characteristic, wherein the frequency-voltage characteristic is stored external to a substrate of the individual integrated circuit,

wherein said frequency-voltage characteristic comprises more than one frequency-voltage pair.

2. The method as described in claim 1 wherein the individual integrated circuit of the plurality of integrated circuits comprises a microprocessor.

3. The method as described in claim 1 wherein the measurement is accessed prior to a packaging of the individual integrated circuit of the plurality of integrated circuits.

4. The method as described in claim 3 wherein the measurement is accessed at a wafer level of the individual integrated circuit of the plurality of integrated circuits.

5. The method as described in claim 1 wherein the measurement is accessed after packaging of the individual integrated circuit of the plurality of integrated circuits.

6. The method as described in claim 1 wherein the associating comprises setting a state of a non-volatile element of the individual integrated circuit of the plurality of integrated circuits to correspond to the characteristic.

7. The method as described in claim 6 wherein the non-volatile element of the individual integrated circuit of the plurality of integrated circuits is resettable.

8. The method as described in claim 6 wherein the non-volatile element of the individual integrated circuit of the plurality of integrated circuits is non-resettable.

9. The method as described in claim 1 wherein the associating comprises setting a state of a non-volatile element of an auxiliary circuit that is used by the individual integrated circuit of the plurality of integrated circuits.

10. The method of claim 9 wherein said auxiliary circuit is contained within common packaging of the individual integrated circuit of the plurality of integrated circuits.

11. A method comprising:

accessing a determination, independent of operating voltage, of a desirable operating frequency for an individual microprocessor of a plurality of microprocessors;

accessing a selection of a voltage for operating the individual microprocessor of the plurality of microprocessors at the desirable operating frequency, the voltage selected based upon characteristics that are specific for the individual microprocessor of the plurality of microprocessors, wherein the characteristics are stored external to a substrate of the individual microprocessor of the plurality of microprocessors; and

operating the individual microprocessor of the plurality of microprocessors at the voltage.

12. The method as described in claim 11 further comprising operating the individual microprocessor of the plurality of microprocessors at the desirable operating frequency.

13. The method as described in claim 11 wherein the characteristics of the individual microprocessor comprise a temperature measurement of the individual microprocessor of the plurality of microprocessors.

14. The method as described in claim 11 wherein the selection is made based on information stored within the individual microprocessor of the plurality of microprocessors, and the information is used to select the characteristics that are specific for the individual microprocessor of the plurality of microprocessors from at least two sets of said characteristics.

15. The method as described in claim 11 wherein the selection is made based on information stored in an auxiliary circuit used by the individual microprocessor, wherein the information is used to select the characteristics that are specific for the individual microprocessor of the plurality of microprocessors from at least two sets of the characteristics.

16. The method as described in claim 11 wherein the selection is made based on the characteristics that are specific for the individual microprocessor of the plurality of microprocessors stored in an auxiliary circuit used by the individual microprocessor of the plurality of microprocessors, wherein the auxiliary circuit comprises only one set of the characteristics.

17. A method comprising:

accessing a set frequency at which an individual microprocessor of a plurality of microprocessors is to operate, wherein the accessing is independent of operating voltage;

using the set frequency, determining a corresponding set voltage at which the individual microprocessor of the plurality of microprocessors operates at the set frequency, wherein the determining is based on a frequency-voltage relationship that is specific to the individual microprocessor of the plurality of microprocessors;

operating the individual microprocessor of the plurality of microprocessors at the set frequency and the corresponding set voltage; and

wherein the frequency-voltage relationship is stored external to a substrate of the individual microprocessor of the plurality of microprocessors.

18. The method as described in claim 17 wherein the frequency-voltage relationship is a continuous function developed by measuring characteristics of the individual microprocessor of the plurality of microprocessors.

19. The method as described in claim 17 wherein the frequency-voltage relationship is a look-up table developed by measuring characteristics of the individual microprocessor of the plurality of microprocessors.

20. The method as described in claim 17 wherein the relationship is accessed from storage of an integrated circuit that is separate from the individual microprocessor of the plurality of microprocessors.

21. The method as described in claim 17 further comprising determining the set frequency by examining a contemporaneous set of operations performed by the individual microprocessor of the plurality of microprocessors.

22. The method as described in claim 17 wherein the frequency-voltage relationship also includes temperature information.

23. A computer system comprising:

an individual microprocessor capable of being operated at a plurality of frequencies and at a plurality of voltages;

set logic for causing the individual microprocessor to operate at a particular voltage and at a particular frequency; and

software for accessing a set frequency independent of operating voltage, using a frequency-voltage relationship that is specific to the individual microprocessor and stored external to the individual microprocessor to determine a corresponding set voltage, and for communicating the set frequency and the voltage to the set logic.

24. The computer system as described in claim 23 wherein the software is also for determining the set frequency by examining a contemporaneous set of operations performed by the individual microprocessor.

25. The computer system as described in claim 23 wherein the frequency-voltage relationship is a continuous function developed by measuring characteristics of the individual microprocessor.

26. The computer system as described in claim 23 wherein the frequency-voltage relationship is a look-up table developed by measuring characteristics of the individual microprocessor.

27. The computer system as described in claim 23 wherein the relationship is stored in an integrated circuit that is separate from the individual microprocessor.

28. The computer system as described in claim 23 wherein the frequency-voltage relationship comprises temperature information.

29. A method comprising:

accessing a measurement of a frequency-voltage relationship specific to an individual microprocessor, wherein the frequency-voltage relationship records at least two frequency-voltage information pairs for enhanced operation of the individual microprocessor; and

associating the frequency-voltage relationship with the individual microprocessor so that the frequency-voltage relationship can be accessed and used during operation of the microprocessor,

wherein said accessing comprises accessing the frequency-voltage relationship from storage external to the individual microprocessor; and

operating said microprocessor corresponding to said frequency-voltage relationship.

30. The method as described in claim 29 wherein the measurement is obtained while the individual microprocessor is in wafer stage of fabrication.

31. The method as described in claim 29 wherein the measurement is obtained before the individual microprocessor is packaged.

32. The method as described in claim 29 wherein the associating comprises programming a memory element on the individual microprocessor with a value that corresponds to the frequency-voltage relationship.

33. The method as described in claim 32 wherein the frequency-voltage relationship is stored external to the individual microprocessor.

34. The method as described in claim 33 wherein the frequency-voltage relationship is stored in an auxiliary integrated circuit device used by the individual microprocessor.

35. The method as described in claim 29 wherein the frequency-voltage relationship is a look-up table.

36. The method as described in claim 29 wherein the frequency-voltage relationship is a function.