System and method for detecting local mechanical stress in integreated devices
First Claim
1. A method of detecting mechanical stress in integrated devices, the method comprising:
- enabling the detection of a photovoltage difference between a scan probe device and a surface portion of an integrated device, the scan probe device being configured to move in response to the photovoltage difference;
irradiating the integrated device with light at a resonant frequency that causes the scan probe device to move in response to the light;
measuring the movement of the scan probe device in response to the photovoltage difference between the scan probe device and the surface portion of the integrated device; and
calculating a local stress level within the integrated device by determining a local work function of the surface portion of the integrated device based upon the movement of the scan probe device.
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Accused Products
Abstract
A method of detecting local mechanical stress in integrated devices is provided, the method comprising: enabling the detection of a photovoltage difference between a scan probe device and a surface portion of an integrated device, the scan probe device being configured to deflect in response to the photovoltage difference; measuring the deflection of the scan probe device in response to the photovoltage difference between the scan probe device and the surface portion of the integrated device; and calculating a local stress level within the integrated device by determining a local work function of the surface portion of the integrated device based upon the deflection of the scan probe device.
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Citations
25 Claims
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1. A method of detecting mechanical stress in integrated devices, the method comprising:
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enabling the detection of a photovoltage difference between a scan probe device and a surface portion of an integrated device, the scan probe device being configured to move in response to the photovoltage difference; irradiating the integrated device with light at a resonant frequency that causes the scan probe device to move in response to the light; measuring the movement of the scan probe device in response to the photovoltage difference between the scan probe device and the surface portion of the integrated device; and calculating a local stress level within the integrated device by determining a local work function of the surface portion of the integrated device based upon the movement of the scan probe device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of detecting mechanical stress in integrated devices, the method comprising:
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irradiating with a first laser signal and a second laser signal at a surface portion of an integrated device enabling the detection of a photovoltage difference between a scan probe device and the surface portion of the integrated device, the scan probe device being suspended over the integrated device; irradiating the integrated device with light at a resonant frequency that causes the scan probe device to move in response to the light; measuring the movement of the scan probe device in response to the photovoltage difference; and calculating a local stress level within the integrated device at the surface portion by determining a local work function of the surface portion of the integrated device based on the movement of the scan probe device. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17)
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18. An apparatus for detecting mechanical stress in integrated devices, the apparatus comprising:
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an integrated device having a surface portion with a local work function; a scan probe device suspended over the integrated device; an optical controller configured for enabling the detection of a photovoltage difference between the integrated device and the scan probe device, the scan probe device being configured to move in response to the photovoltage difference, wherein irradiating the integrated device with light at a resonant frequency causes the scan probe device to move in response to the light; a scan probe detector configured for measuring the movements of the scan probe device in response to the photovoltage difference; and a processing unit in signal communication with the scan probe detector, the processing unit being configured for calculating a local stress level within the integrated device by determining the local work function of the surface portion of the integrated device based upon the movement of the scan probe device. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25)
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Specification