Programming a memory cell with a diode in series by applying reverse bias
First Claim
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1. A method of programming a memory cell comprising:
- applying a reverse bias to the memory cell using a temporary resistor in series with the memory cell, wherein the memory cell comprises a diode and a resistivity switching material element in series;
removing the temporary resistor; and
reading the state of the resistivity switching material element in the memory cell, wherein the state of the resistivity switching material element changes from a first initial state to a second state different from the first state.
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Abstract
A method of programming a memory cell comprises applying a reverse bias to the memory cell using a temporary resistor in series with the memory cell. The memory cell comprises a diode and a resistivity switching material element in series. The state of the resistivity switching material element changes from a first initial state to a second state different from the first state.
37 Citations
14 Claims
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1. A method of programming a memory cell comprising:
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applying a reverse bias to the memory cell using a temporary resistor in series with the memory cell, wherein the memory cell comprises a diode and a resistivity switching material element in series; removing the temporary resistor; and reading the state of the resistivity switching material element in the memory cell, wherein the state of the resistivity switching material element changes from a first initial state to a second state different from the first state. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of programming a memory cell comprising:
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applying a first reverse bias to the memory cell using a first temporary resistor in series with the memory cell, wherein the memory cell comprises a diode and a resistivity switching material element in series, and wherein the state of the resistivity switching material element changes from a first initial state to a second state different from the first state; applying a second reverse bias to the memory cell using a second temporary resistor in series with the memory cell, wherein the state of the resistivity switching material element changes from the second state to a third state different from the second state, and wherein the first temporary resistor and the second temporary resistor have different resistances; applying a third reverse bias to the memory cell using a third temporary resistor in series with the memory cell, wherein the state of the resistivity switching material element changes from the third state to a fourth state different from the third state; removing the temporary resistors; and reading the state of the resistivity switching material element in the memory cell; wherein the first temporary resistor, the second temporary resistor, and the third temporary resistor have different resistances; wherein the first state, the second state, the third state, and the fourth state are different from each other; wherein the first state corresponds to a first data value, the second state corresponds to a second data value, the third state corresponds to a third data value, and the fourth state corresponds to a fourth data value; and wherein the memory cell is part of a memory cell array. - View Dependent Claims (13, 14)
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Specification