Temperature compensation in memory devices and systems
First Claim
Patent Images
1. A memory device, comprising:
- circuitry including one or more groups of sets of fuses to generate a reference current; and
a table with an output that is used to create a multiplication factor applied to a current to change the magnitude of the current and to compensate for temperature changes in the memory device, where the output depends on an operating temperature of the memory device and a difference in the current between a highest specified operating temperature and a lowest specified operating temperature of the memory device.
2 Assignments
0 Petitions
Accused Products
Abstract
Devices, methods, and systems for temperature compensation in memory devices, such as resistance variable memory, among other types of memory are included. A memory device can include a table with an output that is used to create a multiplication factor for a current to compensate for temperature changes in the memory device, where the output depends on an operating temperature of the memory device and a difference in the current between a highest specified operating temperature and a lowest specified operating temperature of the memory device.
13 Citations
29 Claims
-
1. A memory device, comprising:
-
circuitry including one or more groups of sets of fuses to generate a reference current; and a table with an output that is used to create a multiplication factor applied to a current to change the magnitude of the current and to compensate for temperature changes in the memory device, where the output depends on an operating temperature of the memory device and a difference in the current between a highest specified operating temperature and a lowest specified operating temperature of the memory device. - View Dependent Claims (2, 3, 4, 5)
-
-
6. A memory device, comprising:
-
a number of memory cells, wherein at least one memory cell is a phase change random access memory (PCRAM) cell; circuitry including one or more groups of sets of fuses to generate a reference current and mirror the current to a number of locations on the memory device; and a table, wherein the table is used to interpolate an output that is part of a multiplication factor to compensate the reference current for temperature changes in the memory device. - View Dependent Claims (7, 8)
-
-
9. A memory device, comprising:
-
a first group of sets of fuses, where each set of fuses has an output corresponding to a respective one of a plurality of reference currents at one of a lowest specified operating temperature and a highest specified operating temperature of the memory device; a second group of sets of fuses, where each set of fuses of the second group has an output corresponding to a difference in magnitude between a respective one of the reference currents at the lowest specified operating temperature and at the highest specified operating temperature of the memory device; a temperature sensor, where the temperature sensor has an output corresponding to an operating temperature of the memory device; a table populated with data that corresponds to changes in magnitude of the reference currents at various temperatures, where the table output corresponds to a change in magnitude from a selected one of the reference currents at the one of the lowest specified operating temperature and the highest specified operating temperature to the selected one of the reference currents at the operating temperature based on the output from the second group of sets of fuses and the output of the temperature sensor; and one of an adder and a subtractor, where the output of the table and the output of the first group of sets of fuses are one of added or subtracted to produce a signal corresponding to a magnitude of the selected one of the reference currents at the operating temperature, wherein the signal corresponding to the magnitude of the selected one of the reference currents at the operating temperature is used to produce a reference current having the magnitude and that is used in sensing a state of a memory cell. - View Dependent Claims (10, 11, 12, 13)
-
-
14. A method for producing a temperature compensated current, comprising:
-
interpolating a magnitude of the temperature compensated current between the temperature compensated current at a certain low operating temperature and a certain high operating temperature of a memory device using a temperature sensor, a look-up table, and one or more groups of sets of fuses; and producing the temperature compensated current based on the interpolation. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21)
-
-
22. A method for producing a reference current used in sensing a variable resistance memory cell comprising:
-
sensing an operating temperature; determining a desired change in magnitude from the reference current at a particular temperature to the reference current at the operating temperature based at least partially on the sensed operating temperature; providing a signal based on the desired change in magnitude and the reference current at the particular temperature; and producing the reference current at the operating temperature based on the signal. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29)
-
Specification