Inverter system and vehicle

• US 7,954,334 B2
• Filed: 08/18/2004
• Issued: 06/07/2011
• Est. Priority Date: 12/19/2003
• Status: Expired due to Fees

• Current Assignee: Hitachi, Ltd.
• Original Assignee: Hitachi, Ltd.
• Inventors: Maekawa, Keiji, Sasaki, Masataka, Ishikawa, Katsumi, Miyazaki, Hideki
• Primary Examiner(s): Jules; Frantz F
• Assistant Examiner(s): Rahim; Azim
• Application Number:
  US10/920,246
• Publication Number:
  US 20050132726A1
• Time in Patent Office: 2,484 Days
• Field of Search: 361 23- 34, 62/32, 62/36.1, 622/592, 340/584, 340/589
• US Class Current: 62/259.2
• CPC Class Codes: B60L 2200/26 Rail vehicles
• CPC Class Codes: B60L 2210/20 AC to AC converters
• CPC Class Codes: B60L 2240/525 Temperature of converter or components thereof
• CPC Class Codes: B60L 3/00 Electric devices on electrically-propelled vehicles for safety purposes; Monitoring operating variables, e.g. speed, deceleration or energy consumption methods or circuit arrangements for monitoring or controlling batteries or fuel cells B60L58/00
• CPC Class Codes: H02M 7/48 using discharge tubes with control electrode or semiconductor devices with control electrode
• CPC Class Codes: Y02T 10/72 Electric energy management in electromobility

Abstract

An inverter system having a semiconductor device, and a railway vehicle using this inverter, provide a more accurate determination of whether an abnormal heat generation from the inverter is associated with an error of the inverter system or is due to other causes, by use of a plurality of temperature detecting elements at a plurality of sites associated with the semiconductor device. An error detection section applies inputs from the temperature detecting elements, captures a trend of the differential value based on the plurality of temperature inputs using period sampling wherein an error associated with the semiconductor device, and not from some other condition such as outside environment temperature, is determined based on differences from, or a change in, the initial trend.

Claims

1. An inverter system, comprising:

a semiconductor device;

a control circuit for on/off control of said semiconductor device;

first and second temperature detectors for detecting temperature at first and second sites, respectively; and

circuitry operatively associated with the first and second temperature detectors that calculates the temperature at the second site that is at or in said semiconductor device based on;

an actual temperature value detected by said first temperature detector at the first site adjacent said semiconductor device and a temperature calculation parameter, being one of a cooling air velocity, a vehicle velocity, and a cooling water velocity,

so as to capture with periodic sampling over a selected period of time a trend of a differential value between said calculated temperature and the actual temperature value detected by said second temperature detector, wherein the trend of the differential value is being given as an approximate curve formed by the plurality of differential values corresponding to a plurality of loss values in the inverter system,

and that determines that an error exists in the inverter system when a difference between the captured trend and an initial predetermined trend or on a change in the captured trend over the selected period of time exceeds a predetermined value.

2. The inverter system described in claim 1 wherein said first and second temperature detectors are a temperature detecting element below the semiconductor device and an outside air temperature detecting element, respectively.

3. The inverter system described in claim 1 wherein said first and second temperature detectors are a temperature detecting element inside the semiconductor device and an outside air temperature detecting element, respectively.

4. The inverter system described in claim 1 wherein said first and second temperature detectors are an atmosphere temperature detecting element inside the semiconductor device and an outside air temperature detecting element, respectively.

5. The inverter system of claim 1, wherein a plot of said differential value versus a theoretical loss value comprises a predetermined reference line in said temperature calculation circuitry.

6. A railway vehicle comprising:

an inverter system having a semiconductor device and a control circuit for on/off control of said semiconductor device;

a motor configured to be controlled by said inverter system;

first and second temperature detectors for detecting temperature at first and second sites, respectively; and

circuitry operatively associated with the first and second temperature detectors that calculates the temperature at the second site that is at or in said semiconductor device based on;

an actual temperature value detected by at said first temperature detector at the first site adjacent said semiconductor device and a temperature calculation parameter being one of a cooling air velocity, a vehicle velocity, and a cooling water velocity,

so as to capture with periodic sampling a trend of a differential value between said calculated temperature and the actual temperature value detected by said second temperature detector, wherein the trend of the differential value is given as an approximate curve formed by the plurality of differential values corresponding to a plurality of loss values in the inverter system,

and that in an operational pattern in a specific section of said railway vehicle based on a difference from an initial trend or in a change of the trend to detect an error of the inverter system.

7. The vehicle described in claim 6 wherein, if the error has been detected, an operation command value is modified so as to reduce inverter-generated heat.

8. The railway vehicle described in claim 6, wherein said circuitry performs periodic sampling in the operation pattern in a specific section of said railway vehicle.

9. A method for detecting an error in an inverter system, comprising:

detecting temperatures at first and second sites in relation to a semiconductor device of the inverter system;

calculating temperature at the second site that is at or in the semiconductor device based on;

an actual temperature value detected at the first site adjacent the semiconductor device and a temperature calculation parameter being one of a cooling air velocity, a vehicle velocity, and a cooling water velocity,

so as to capture with periodic sampling over a selected time period a trend of differential value between the calculated temperature and the actual temperature value determined by said second temperature detector wherein the trend of the differential value is being given as an approximate curve formed by the plurality of differential values corresponding to a plurality of loss values in the inverter system; and

determining that an error exists in the inverter system when a difference between the captured trend and an initial predetermined trend or on a change in the captured trend over the selected period of time exceeds a predetermined value.