Stage yield prediction
First Claim
Patent Images
1. A computer-implemented method comprising:
- storing defectivity data identifying one or more defects associated with one or more previous wafer designs in memory, wherein the defectivity data comprises data gathered from inspections performed on wafers having the previous wafer designs;
dividing the defects associated with one or more design elements of the previous wafer designs into systematic defects and random defects;
for each design layout of a new wafer design, predicting a yield separately for systematic defects and random defects associated with the new wafer design using the defectivity data associated with the previous wafer designs, wherein the new wafer design has no inspection and metrology data gathered; and
calculating a combined yield based on the yield predicted for the systematic defects and the yield predicted for the random defects.
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Abstract
In one embodiment, a method for predicting yield during the design stage includes receiving defectivity data identifying defects associated with previous wafer designs, and dividing the defects into systematic defects and random defects. For each design layout of a new wafer design, yield is predicted separately for the systematic defects and the random defects. A combined yield is then calculated based on the yield predicted for the systematic defects and the yield predicted for the random defects.
39 Citations
21 Claims
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1. A computer-implemented method comprising:
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storing defectivity data identifying one or more defects associated with one or more previous wafer designs in memory, wherein the defectivity data comprises data gathered from inspections performed on wafers having the previous wafer designs; dividing the defects associated with one or more design elements of the previous wafer designs into systematic defects and random defects; for each design layout of a new wafer design, predicting a yield separately for systematic defects and random defects associated with the new wafer design using the defectivity data associated with the previous wafer designs, wherein the new wafer design has no inspection and metrology data gathered; and calculating a combined yield based on the yield predicted for the systematic defects and the yield predicted for the random defects. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A computer-implemented system comprising:
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memory to store design data for previous wafer designs and new wafer designs, wherein the design data comprises at least one of;
wafer design layouts, and routing information for the wafer design layouts;memory to store defectivity information associated with the previous wafer designs, wherein the defectivity data comprises data gathered from inspections performed on wafers having the previous wafer designs; and a design-stage yield analyzer, coupled to the memory to identify a new wafer design, wherein the new wafer design has no inspection and metrology data gathered, to identify defects on the new wafer design using the defectivity information associated with the previous wafer designs, and to predict yield for each wafer design layout for the new wafer design. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A computer-implemented apparatus comprising:
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means for storing defectivity data identifying one or more defects associated with one or more previous wafer designs, wherein the defectivity data comprises data gathered from inspections performed on wafers having the previous wafer designs; means for dividing the defects associated with one or more design elements of the previous wafer designs into systematic defects and random defects; for each design layout of a new wafer design, means for predicting a yield separately for systematic defects and random defects associated with the new wafer design using the defectivity data associated with the previous wafer designs, wherein the new wafer design has no inspection and metrology data gathered; and means for calculating a combined yield based on the yield predicted for the systematic defects and the yield predicted for the random defects.
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19. A non-transitory computer readable storage medium, comprising executable instructions which when executed on a processing system cause the processing system to perform a method comprising:
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storing defectivity data identifying one or more defects associated with one or more previous wafer designs in memory, wherein the defectivity data comprises data gathered from inspections performed on wafers having the previous wafer designs; dividing the defects associated with one or more design elements of the previous wafer designs into systematic defects and random defects; for each design layout of a new wafer design, predicting a yield separately for systematic defects and random defects associated with the new wafer design using the defectivity data associated with the previous wafer designs, wherein the new wafer design has no inspection and metrology data gathered; and calculating a combined yield based on the yield predicted for the systematic defects and the yield predicted for the random defects. - View Dependent Claims (20, 21)
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Specification