On die thermal sensor
First Claim
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1. An on die thermal sensor (ODTS) for use in a semiconductor device, comprising:
- a temperature information code generation unit for sensing an internal temperature of the semiconductor device in response to first and second enable signals and for generating a temperature information code including the sensed temperature information; and
a flag signal logic determination unit for generating a plurality of first flag signals having temperature information and for determining whether the plurality of first flag signals have a predetermined logic level or a variable logic level in response to the first and second enable signals.
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Abstract
An on die thermal sensor (ODTS) for use in a semiconductor memory device includes: a temperature information code generation unit for sensing an internal temperature of the semiconductor memory device in response to first and second enable signals and for generating a temperature information code which includes the sensed temperature information; and a flag signal logic determination unit for generating a plurality of first flag signals having temperature information and determining whether the plurality of first flag signals have a predetermined logic level or a variable logic level in response to the first and second enable signals.
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Citations
25 Claims
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1. An on die thermal sensor (ODTS) for use in a semiconductor device, comprising:
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a temperature information code generation unit for sensing an internal temperature of the semiconductor device in response to first and second enable signals and for generating a temperature information code including the sensed temperature information; and a flag signal logic determination unit for generating a plurality of first flag signals having temperature information and for determining whether the plurality of first flag signals have a predetermined logic level or a variable logic level in response to the first and second enable signals. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A semiconductor device, comprising:
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a temperature information code generation unit for sensing an internal temperature of the semiconductor device at an on state in response to first and second enable signals and generating a temperature information code including the sensed temperature information; a flag signal logic determination unit for generating a plurality of first flag signals having temperature information, and determining whether the plurality of first flag signals have a predetermined logic level or a variable logic level in response to the first and second enable signals; and a self refresh period change unit for changing a period of a self refresh operation at a self refresh mode in response to the plurality of first flag signals. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25)
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Specification