Systems and methods for over-the-air testing of wireless systems

• US 7,965,986 B2
• Filed: 06/07/2007
• Issued: 06/21/2011
• Est. Priority Date: 06/07/2006
• Status: Active Grant

• Current Assignee: ETS-Lindgren LP (ESCO Technologies, Inc.)
• Original Assignee: ETS-Lindgren LP (ESCO Technologies, Inc.)
• Inventors: Foegelle, Michael
• Primary Examiner(s): PHAM, TUAN
• Application Number:
  US11/810,965
• Publication Number:
  US 20080305754A1
• Time in Patent Office: 1,475 Days
• Field of Search: 455/423, 455/67.11, 455/67.12, 455/67.13, 455/67.14, 455/67.16, 324/627, 324/637, 324/629, 343/703, 343/786
• US Class Current: 455/67.11
• CPC Class Codes: G01R 1/04 Housings; Supporting members; Arrangements of terminals
• CPC Class Codes: G01R 17/20 AC or DC potentiometric measuring arrangements
• CPC Class Codes: H04B 17/20 of receivers
• CPC Class Codes: H04W 24/00 Supervisory, monitoring or testing arrangements
• CPC Class Codes: H04W 24/06 Testing, supervising or monitoring using simulated traffic

Abstract

Embodiments include systems and methods for over-the-air testing of wireless systems. Embodiments comprise separated anechoic chambers containing wireless devices. The anechoic chambers are connected by propagation path corridors.

Claims

1. A test configuration for testing a wireless device, the test configuration to simulate multi-path effects, the test configuration comprising:

an anechoic chamber with a first region to contain and partially surround the wireless device and a second region to contain and partially surround a transmitting device;

wherein an absorbing wall separates the first region and the second region;

a first propagation path corridor to enable at least a first propagation path between the wireless device and the transmitting device, the first propagation path corridor formed by inserting a first absorbing baffle in a first position in the anechoic chamber; and

a second propagation path corridor to enable at least a second propagation path between the wireless device and the transmitting device, the second propagation path corridor formed by inserting a second absorbing baffle in a second position in the anechoic chamber.

2. The test configuration of claim 1, wherein the first propagation path and the second propagation paths include reflections against an unshielded wall of the anechoic chamber.

3. The test configuration of claim 2, wherein a first number of reflections is associated with the first propagation path and a second number of reflections different from the first number of reflections is associated with the second propagation path.

4. The test configuration of claim 1, wherein the anechoic chamber includes at least one rotatable obstacle that when rotated varies a multi-path effect of the chamber.

5. The test configuration of claim 4 wherein at least a first surface of the rotatable obstacle is covered with absorber.