Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit
First Claim
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1. A microcontactor probe comprising:
- an insulating holder formed with a support hole;
a lead conductor exposed to the support hole; and
a resilient conductive assembly fitted in the support hole and kept from falling, the conductive assembly comprising;
a first plunger adapted to be exposed outside the support hole;
a second plunger adapted to contact the lead conductor; and
a coil spring biasing the first and second plungers in opposite directions, the coil spring having fixed ends to the first and second plungers for electrical conduction and a continuous tubular tight wound portion,the tight wound portion including;
a sliding conduction part configured for one of the first and second plungers to slidably contact thereon for electrical conduction; and
a fixed conduction part configured for the other of the first and second plungers to be fixed thereto for electrical conduction.
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Abstract
In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.
14 Citations
10 Claims
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1. A microcontactor probe comprising:
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an insulating holder formed with a support hole; a lead conductor exposed to the support hole; and a resilient conductive assembly fitted in the support hole and kept from falling, the conductive assembly comprising; a first plunger adapted to be exposed outside the support hole; a second plunger adapted to contact the lead conductor; and a coil spring biasing the first and second plungers in opposite directions, the coil spring having fixed ends to the first and second plungers for electrical conduction and a continuous tubular tight wound portion, the tight wound portion including; a sliding conduction part configured for one of the first and second plungers to slidably contact thereon for electrical conduction; and a fixed conduction part configured for the other of the first and second plungers to be fixed thereto for electrical conduction. - View Dependent Claims (2, 3, 4, 5)
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6. An electric probe module comprising:
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an insulating holder formed with a support hole; and a resilient conductive assembly fitted in the support hole and kept from falling, the conductive assembly comprising; a first plunger adapted to be exposed at an end of the support hole; a second plunger facing another end of the support hole; and a coil spring biasing the first and second plungers in opposite directions, the coil spring having fixed ends to the first and second plungers for electrical conduction and a continuous tubular tight wound portion, the tight wound portion comprising; a sliding conduction part configured for one of the first and second plungers to slidably contact thereon for electrical conduction; and a fixed conduction part configured for the other of the first and second plungers to be fixed thereto for electrical conduction. - View Dependent Claims (7, 8, 9, 10)
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Specification