Determining endpoint in a substrate process
First Claim
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1. An endpoint detection method comprising:
- (a) reflecting polychromatic light from a substrate, the polychromatic light having a plurality of wavelengths;
(b) generating from the reflected polychromatic light, a plurality of light beams having different wavelengths; and
(c) determining a wavelength of light from the plurality of light beams at which a local intensity of the reflected polychromatic light is maximized during the processing of the substrate.
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Abstract
An endpoint detection method for detecting an endpoint of a process comprises reflecting polychromatic light from a substrate, the polychromatic light having a plurality of wavelengths. A plurality of light beams having different wavelengths are generated from the reflected polychromatic light. A wavelength of light is determined from the plurality of light beams, at which a local intensity of the reflected light is maximized.
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25 Claims
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1. An endpoint detection method comprising:
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(a) reflecting polychromatic light from a substrate, the polychromatic light having a plurality of wavelengths; (b) generating from the reflected polychromatic light, a plurality of light beams having different wavelengths; and (c) determining a wavelength of light from the plurality of light beams at which a local intensity of the reflected polychromatic light is maximized during the processing of the substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An endpoint detection method comprising:
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(a) reflecting polychromatic light from a substrate, the polychromatic light having a plurality of wavelengths; (b) passing the reflected polychromatic light through a prism to generate a plurality of light beams having different wavelengths; and (c) determining a wavelength of light from the plurality of light beams at which a local intensity of the reflected light is maximized during the processing of the substrate. - View Dependent Claims (13, 14, 15, 16, 17)
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18. An endpoint detection method comprising:
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(a) reflecting polychromatic light from a substrate, the polychromatic light having a plurality of wavelengths; (b) filtering the reflected polychromatic light to generate light beams having different wavelengths; and (c) determining a wavelength of light from the plurality of light beams at which a local intensity of the reflected light is maximized during the processing of the substrate. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25)
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Specification