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Operation methods for memory cell and array for reducing punch through leakage

  • US 7,974,127 B2
  • Filed: 11/04/2008
  • Issued: 07/05/2011
  • Est. Priority Date: 11/06/2007
  • Status: Active Grant
First Claim
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1. An integrated circuit comprising:

  • a plurality of memory cells on a substrate; and

    a circuit unit performing steps comprising;

    selecting a first memory cell, the first memory cell comprising a first doped region, a second doped region, a first channel region therebetween, a first charge storage member overlying the first channel region, and a first control gate overlying the first charge storage member;

    selecting a third doped region, the third doped region being separated from the second doped region by at least a second channel region, a second control gate overlying the second channel region;

    applying a bias arrangement to program the first memory cell, including;

    applying a substrate voltage to the substrate;

    applying a first voltage to the first doped region;

    applying a second voltage to the third doped region;

    applying a third voltage to the first control gate and the second control gate; and

    floating the second doped region.

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