Computer-implemented methods for determining if actual defects are potentially systematic defects or potentially random defects
First Claim
1. A computer-implemented method for determining if actual defects are potentially systematic defects or potentially random defects, comprising:
- comparing a number of actual defects in a group to a number of randomly generated defects in a group, wherein the actual defects are detected on a wafer, and wherein a portion of a design on the wafer proximate a location of each of the actual defects in the group and each of the randomly generated defects in the group is substantially the same; and
determining if the actual defects in the group are potentially systematic defects or potentially random defects based on results of said comparing, wherein said determining comprises determining that the actual defects in the group are potentially systematic defects if the number of the actual defects in the group is greater than the number of the randomly generated defects in the group and determining that the actual defects in the group are potentially random defects if the number of the actual defects in the group is not greater than the number of the randomly generated defects in the group, and wherein said comparing and said determining are performed using a computer system.
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Accused Products
Abstract
Various computer-implemented methods for determining if actual defects are potentially systematic defects or potentially random defects are provided. One computer-implemented method for determining if actual defects are potentially systematic defects or potentially random defects includes comparing a number of actual defects in a group to a number of randomly generated defects in a group. The actual defects are detected on a wafer. A portion of a design on the wafer proximate a location of each of the actual defects in the group and each of the randomly generated defects in the group is substantially the same. The method also includes determining if the actual defects in the group are potentially systematic defects or potentially random defects based on results of the comparing step.
364 Citations
13 Claims
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1. A computer-implemented method for determining if actual defects are potentially systematic defects or potentially random defects, comprising:
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comparing a number of actual defects in a group to a number of randomly generated defects in a group, wherein the actual defects are detected on a wafer, and wherein a portion of a design on the wafer proximate a location of each of the actual defects in the group and each of the randomly generated defects in the group is substantially the same; and determining if the actual defects in the group are potentially systematic defects or potentially random defects based on results of said comparing, wherein said determining comprises determining that the actual defects in the group are potentially systematic defects if the number of the actual defects in the group is greater than the number of the randomly generated defects in the group and determining that the actual defects in the group are potentially random defects if the number of the actual defects in the group is not greater than the number of the randomly generated defects in the group, and wherein said comparing and said determining are performed using a computer system. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A non-transitory computer-readable medium, comprising program instructions executable on a computer system for performing a computer-implemented method for determining if actual defects are potentially systematic defects or potentially random defects, wherein the computer-implemented method comprises:
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comparing a number of actual defects in a group to a number of randomly generated defects in a group, wherein the actual defects are detected on a. wafer, and wherein a portion of a design on the wafer proximate a location of each of the actual defects in the group and each of the randomly generated detects in the group is substantially the same; and determining if the actual defects in the group are potentially systematic defects or potentially random defects based on results of said comparing, wherein said determining comprises determining that the actual defects in the group are potentially systematic defects if the number of the actual defects in the group is greater than the number of the randomly generated defects in the group and determining that the actual defects in the group are potentially random defects if the number of the actual defects in the group is not greater than the number of the randomly generated defects in the group.
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13. A system configured to determine if actual defects are potentially systematic defects or potentially random defects, comprising:
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an inspection system configured to detect actual defects on a wafer; and a computer system configured to; compare a number of the actual defects in a group to a number of randomly generated defects in a group, wherein a portion of a design on the wafer proximate a location of each of the actual defects in the group and each of the randomly generated defects in the group is substantially the same; and determine if the actual defects in the group are potentially systematic defects or potentially random defects based on results of the comparison, wherein determining if the actual defects in the group are potentially systematic defects or potentially random defects comprises determining that the actual defects in the group are potentially systematic defects if the number of the actual defects in the group is greater than the number of the randomly generated defects in the group and determining that the actual defects in the group are potentially random defects if the number of the actual defects in the group is not greater than the number of the randomly generated defects in the group.
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Specification