Scintillation detector reflector

• US 7,977,646 B2
• Filed: 04/17/2009
• Issued: 07/12/2011
• Est. Priority Date: 04/17/2008
• Status: Expired due to Fees

• Current Assignee: Saint-Gobain Ceramics & Plastics Incorporated (Compagnie De Saint-Gobain)
• Original Assignee: Saint-Gobain Ceramics & Plastics Incorporated (Compagnie De Saint-Gobain)
• Inventors: Hunt, Jeffrey D.
• Primary Examiner(s): Porta; David P
• Assistant Examiner(s): Taningco; Marcus H
• Application Number:
  US12/425,485
• Publication Number:
  US 20090261262A1
• Time in Patent Office: 816 Days
• Field of Search: 250/361.R, 250/370.11, 156/60, 204/192.1
• US Class Current: 250/370.11
• CPC Class Codes: G01T 1/2002 Optical details, e.g. reflecting or diffusing layers
• CPC Class Codes: Y10T 156/10 Methods of surface bonding and/or assembly therefor

Abstract

A scintillation detector and system includes a scintillation crystal having a surface and a reflector surrounding at least a portion of the scintillation crystal. The reflector includes an organic substrate and an inorganic material fixed to the organic substrate, wherein at least a portion of the inorganic material contacts at least a portion of the crystal surface.

Claims

1. A scintillation detector, comprising:

a scintillation crystal having a crystal surface; and

a reflector surrounding at least a portion of said scintillation crystal, wherein said reflector includes an organic substrate and a layer of inorganic material fixed to said organic substrate, wherein said layer of inorganic material contacts at least a portion of said crystal surface.

2. The scintillation detector of claim 1, wherein said reflector includes a reflector surface and said layer of inorganic material includes one or more facets, wherein at least a portion of said one or more facets of at least a portion of said layer of inorganic material is exposed at said reflector surface.

3. The scintillation detector of claim 1, wherein said organic substrate exhibits a moisture vapor transmission of 35 g/m²d or less as measured by ASTM E-96.

4. The scintillation detector of claim 1, wherein said detector exhibits a peak pulse height of at least 0.25% greater than a detector including a reflector consisting of said organic substrate.

5. The scintillation detector of claim 1, wherein said organic substrate comprises a fabric, wherein said fabric comprises fluoropolymer fibers.

6. The scintillation detector of claim 1, wherein said organic substrate has a thickness in the range of 1 μ

m to 1,000 μ

m.

7. The scintillation detector of claim 1, wherein said layer of inorganic material is selected from the group consisting of metal oxide, metal carbide, metal nitride, metal boride and metal sulfide, and reflects at least a portion of incident light at one or more wavelengths in the range of 200 nm to 600 nm.

8. The scintillation detector of claim 1, wherein said layer of inorganic material has a thickness in the range of 0.01 μ

m to 500 μ

m.

9. The scintillation detector of claim 1, wherein said scintillation crystal and said reflector are present in a medical device.

10. The scintillation detector of claim 9, wherein said medical device is selected from the group consisting of a positron emission tomography scanner, a gamma camera, and a computed tomography scanner.

11. The scintillation detector of claim 1, wherein said scintillation crystal and said reflector are present in a well logging detector.

12. The scintillation detector of claim 1, wherein said scintillation crystal and said reflector are present in an inspection apparatus.

13. The scintillation detector of claim 12, wherein said inspection apparatus is selected from the group consisting of a thermal neutron activation analysis detector, luggage scanner, thickness gauge, liquid level gauge, active security and manifest verification, passive security and manifest verification, active spectroscopy, passive spectroscopy, active gross counters and passive gross counters.

14. The scintillation detector of claim 1, wherein said scintillation crystal and said reflector are present in a research device.

15. The scintillation detector of claim 1, wherein said layer of inorganic material comprises substantial inorganic material.

16. A method of forming a scintillation detector, comprising:

contacting at least a portion of a scintillation crystal with a reflector, wherein said reflector includes an organic substrate and a layer of inorganic material fixed to said organic substrate, wherein said layer of inorganic material contacts at least a portion of said crystal surface.

17. The method of claim 16, wherein said reflector includes a reflector surface and said layer of inorganic material includes one or more facets, wherein at least a portion of said one or more facets of at least a portion of said layer of inorganic material is exposed at said reflector surface.

18. The method of claim 16, wherein said organic substrate exhibits a moisture vapor transmission of 35 g/m²d or less as measured by ASTM E-96.

19. The method of claim 16, wherein said organic substrate comprises a fluoropolymer.

20. The method of claim 16, wherein said organic substrate has a thickness in the range of 1 μ

m to 1,000 μ

m.

21. The method of claim 16, wherein said layer of inorganic material is selected from the group consisting of metal oxide, metal carbide, metal nitride, metal boride and metal sulfide, and reflects at least a portion of incident light at one or more wavelengths in the range of 200 nm to 600 nm.

22. The method of claim 16, wherein said layer of inorganic material has a thickness in the range of 0.01 μ

m to 500 μ

m.

23. A scintillation detection system, comprising:

a scintillation crystal having a surface; and

a reflector surrounding at least a portion of said scintillation crystal, wherein said reflector includes an organic substrate and a layer of inorganic material adhered to said organic substrate, wherein said layer of inorganic material coats at least a portion of said crystal surface;

a photodetector in optical communication with said scintillation crystal; and

an analyzer in electrical communication with said photodetector.

24. The scintillation detection system of claim 23, wherein said reflector includes a reflector surface and said layer of inorganic material includes one or more facets, wherein at least a portion of said one or more facets of at least a portion of said layer of inorganic material is exposed at said reflector surface.

25. A scintillation detector, comprising:

a scintillation crystal having a crystal surface; and

a reflector surrounding at least a portion of said scintillation crystal, wherein said reflector includes an organic substrate and an inorganic material fixed to said organic substrate, wherein at least a portion of said inorganic material contacts at least a portion of said crystal surface and said organic substrate comprises a fabric, wherein said fabric comprises fluoropolymer.

26. A method of forming a scintillation detector, comprising:

contacting at least a portion of a scintillation crystal with a reflector, wherein said reflector includes an organic substrate and an inorganic material fixed to said organic substrate, wherein at least a portion of said inorganic material contacts at least a portion of said crystal surface and wherein said organic substrate comprises a fluoropolymer.