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Haptic profiling system and method

  • US 7,982,711 B2
  • Filed: 12/17/2004
  • Issued: 07/19/2011
  • Est. Priority Date: 12/19/2003
  • Status: Active Grant
First Claim
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1. An apparatus for haptically profiling a mechanical device, comprising:

  • a characterization module configured to receive data associated with a plurality of operational characteristics of the mechanical device, the plurality of operational characteristics being associated with a perceptual experience of the mechanical device, wherein the data is received as input from the mechanical device, wherein the perceptual experience comprises a mechanically generated first tactile output that is experienced by a first user when interacting with the mechanical device;

    a conversion module coupled to the characterization module, the conversion module configured to automatically produce, substantially without user intervention, a parametric data set associated with the perceptual experience of the mechanical device based on the received data; and

    a controller that receives the parametric data set and outputs a signal based on the parametric data set to a programmable haptic device, wherein the signal causes the programmable haptic device to generate haptic effects;

    wherein the haptic effects simulate the perceptual experience of the mechanical device;

    wherein the simulation comprises generating a second tactile output that is experienced by a second user when interacting with the programmable haptic device, wherein the second tactile output is substantially similar to the mechanically generated first tactile output.

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