Method for testing reliability of solid-state storage medium

• US 7,992,061 B2
• Filed: 02/17/2009
• Issued: 08/02/2011
• Est. Priority Date: 11/18/2008
• Status: Active Grant

• Current Assignee: Solid State Storage Technology Corporation (Kioxia Corporation)
• Original Assignee: Industrial Technology Research Institute
• Inventors: Zeng, Wen-Jun
• Primary Examiner(s): Britt; Cynthia
• Assistant Examiner(s): Merant; Guerrier
• Application Number:
  US12/372,692
• Publication Number:
  US 20100125767A1
• Time in Patent Office: 896 Days
• Field of Search: None
• US Class Current: 714/723
• CPC Class Codes: G11C 11/16 using elements in which the storage effect is based on magnetic spin effect
• CPC Class Codes: G11C 2029/0409 Online test
• CPC Class Codes: G11C 2029/0411 Online error correction
• CPC Class Codes: G11C 29/52 Protection of memory contents; Detection of errors in memory contents

Abstract

A method for testing a reliability of a solid-state storage medium is provided, wherein the solid-state storage medium has a plurality of blocks. First, a lifetime of each of the blocks of the solid-state storage medium is obtained. Then, an erase count of each of the blocks is obtained, and whether the erase count is greater than a predetermined erase count is determined. After that, those blocks having their erase counts greater than the predetermined erase count are accumulated to generate a problematic block number, and a test report is output.

Claims

1. A method for testing a reliability of a solid-state storage medium, wherein the solid-state storage medium comprises a plurality of blocks, the method comprising:

obtaining a lifetime of each of the blocks of the solid-state storage medium;

obtaining an erase count of each of the blocks for each erase;

determining whether the erase count of each of the blocks is greater than a predetermined erase count;

accumulating the blocks having the erase counts greater than the predetermined erase count to generate a problematic block;

calculating a ratio of the problematic block number to a total block number of the solid-state storage medium, and using the ratio as a test report; and

outputting the test report.

2. The method according to claim 1, wherein the lifetime is a total erase count of the block.

3. The method according to claim 1, wherein the predetermined erase count is a fixed percentage of the lifetime.

4. The method according to claim 1, wherein the lifetime is input into a host system by a user.

5. The method according to claim 1, wherein the lifetime is obtained by a host system through an interface command between the host system and the solid-state storage medium.

6. The method according to claim 1 further comprising:

obtaining an error correction code (ECC) endurance of each of the blocks;

obtaining a bidden error according to the ECC endurance; and

merging the hidden error of each of the blocks into the problematic block number to be the test report.

7. The method according to claim 6, wherein the ECC endurance is obtained by a host system through an interface command between the host system and the solid-state storage medium.

8. The Method according to claim 1, further comprising:

obtaining an invalid page number of each of the blocks, and calculating a corresponding block number according to the invalid page number; and

merging the block number corresponding to the invalid page number into the problematic block number to be the test report.

9. The method according to claim 8, wherein the invalid page number is obtained by a host system through an interface command between the host system and the solid-state storage medium.

10. A method for testing a reliability of a solid-state storage medium, wherein the solid-state storage medium comprises a plurality of blocks, the method comprising:

determining a test process;

sending a data of a test item to a host through an interface command by using the solid-state storage medium; and

obtaining a data difference of the test item before and after the test process;

calculating a ratio of the problematic block number to a total block number of the solid-state storage medium, and using the ratio as a test report; and

outputting the test report,

wherein the test item is to determine whether an erase count of each of the blocks is greater than a redetermined erase court and the step of sending the data of the test item further comprises;

accumulating the blocks having the erase counts greater than the predetermined erase count to generate a problematic block number and outputting the test report.

11. The method according to claim 10, wherein the predetermined erase count is determined by a fixed percentage of a lifetime of each of the blocks.

12. The method according to claim 10, wherein the test item further comprises an invalid page, and the step of sending the data of the test item further comprises:

obtaining an invalid page number of each of the blocks, and calculating a corresponding block number according to the invalid page number; and

merging the block number into the problematic block number to be the test report.

13. The method according to claim 10, wherein the test item is an ECC endurance of each of the blocks.

14. The method according to claim 13, wherein the step of sending the data of the test item further comprises:

obtaining the ECC endurance of each of the blocks,

obtaining a hidden error according to the ECC endurance; and

serving the hidden error of each of the blocks as the test report.