Storage device temperature sensing
First Claim
1. A storage device transporter for transporting a storage device and for mounting the storage device within a test slot, the storage device transporter comprising:
- a frame configured to receive and support the storage device; and
a clamping mechanism associated with the frame and operable to apply a clamping force to the storage device supported by the frame;
a temperature sensor; and
printed circuitry comprising one or more electrically conductive layers;
wherein the temperature sensor is integrated in the one or more electrically conductive layers, andwherein the clamping mechanism is operable to move the temperature sensor into contact with the storage device supported by the frame for measuring a temperature of the storage device.
5 Assignments
0 Petitions
Accused Products
Abstract
A storage device transporter is provided for transporting a storage device and for mounting a storage device within a test slot. The storage device transporter includes a frame that is configured to receive and support a storage device, and a clamping mechanism associated with the frame. The clamping mechanism is operable to apply a clamping force to a storage device supported by the frame The storage device transporter also includes a temperature sensor (e.g., a thermocouple). The clamping mechanism is operable to move the temperature sensor into contact with a storage device supported by the frame for measuring a temperature of the storage device.
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Citations
23 Claims
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1. A storage device transporter for transporting a storage device and for mounting the storage device within a test slot, the storage device transporter comprising:
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a frame configured to receive and support the storage device; and a clamping mechanism associated with the frame and operable to apply a clamping force to the storage device supported by the frame; a temperature sensor; and printed circuitry comprising one or more electrically conductive layers; wherein the temperature sensor is integrated in the one or more electrically conductive layers, and wherein the clamping mechanism is operable to move the temperature sensor into contact with the storage device supported by the frame for measuring a temperature of the storage device. - View Dependent Claims (2, 3, 4)
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5. A storage device transporter for transporting a storage device and for mounting the storage device within a test slot, the storage device transporter comprising:
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a frame configured to receive and support the storage device; and a clamping mechanism associated with the frame and operable to apply a clamping force to the storage device supported by the frame; a temperature sensor; and an electric heating element arranged to heat the storage device supported by the frame, wherein the clamping mechanism is operable to move the temperature sensor into contact with the storage device supported by the frame for measuring a temperature of the storage device. - View Dependent Claims (6, 7, 8)
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9. A test slot assembly comprising:
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A.) a storage device transporter comprising; i.) a frame configured to receive and support a storage device, ii.) a temperature sensor, iii.) a clamping mechanism associated with the frame, the clamping mechanism being operable to apply a clamping force to the storage device supported by the frame and configured to move the temperature sensor into contact with the storage device supported by the frame for measuring a temperature of the storage device, and iv.) printed circuitry comprising contact terminals in electrical communication with the temperature sensor; and B.) a test slot comprising; i.) a test compartment for receiving and supporting the storage device transporter, ii) a connection interface circuit, and iii) electrically conductive contacts in electrical communication with the connection interface circuit and arranged to engage the contact terminals of the printed circuitry when the storage device transporter is in the test compartment. - View Dependent Claims (10, 11, 12, 13)
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14. A test slot assembly comprising:
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A.) a storage device transporter comprising; i.) a frame configured to receive and support a storage device, ii.) a temperature sensor, iii.) a clamping mechanism associated with the frame, the clamping mechanism being operable to apply a clamping force to the storage device supported by the frame and configured to move the temperature sensor into contact with the storage device supported by the frame for measuring a temperature of the storage device, and iv.) printed circuitry comprising one or more electrically conductive layers; wherein the temperature sensor is integrated in the one or more electrically conductive layers; and B.) a test slot comprising; i.) a test compartment for receiving and supporting the storage device transporter. - View Dependent Claims (15, 16)
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17. A test slot assembly comprising:
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A.) a storage device transporter comprising; i.) a frame configured to receive and support a storage device, ii.) a temperature sensor, iii.) a clamping mechanism associated with the frame, the clamping mechanism being operable to apply a clamping force to the storage device supported by the frame and configured to move the temperature sensor into contact with the storage device supported by the frame for measuring a temperature of the storage device, and iv.) an electrical heating element arranged to heat the storage device supported by the frame; and B.) a test slot comprising; i.) a test compartment for receiving and supporting the storage device transporter. - View Dependent Claims (18, 19, 20)
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21. A storage device testing system comprising:
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A.) a storage device transporter comprising; i.) a frame configured to receive and support a storage device, ii.) a temperature sensor, iii.) a clamping mechanism associated with the frame, the clamping mechanism being operable to apply a clamping force to the storage device supported by the frame and configured to move the temperature sensor into contact with the storage device supported by the frame for measuring a temperature of the storage device, and iv.) an electric heating element arranged to heat the storage device supported by the frame; and B.) a test slot comprising; i.) a test compartment for receiving and supporting the storage device transporter; ii.) a connection interface board; and C.) test electronics configured to communicate one or more test routines to a storage device disposed within the test compartment, wherein the connection interface board is configured to provide electrical communication between the temperatures sensor and the test electronics when the storage device transporter is disposed within the test compartment. - View Dependent Claims (22, 23)
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Specification