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Integrated circuit testing module including signal shaping interface

  • US 8,001,439 B2
  • Filed: 10/25/2006
  • Issued: 08/16/2011
  • Est. Priority Date: 09/28/2001
  • Status: Expired due to Fees
First Claim
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1. A system to test an integrated circuit, comprising:

  • one or more input components configured to receive input signals having a first slew rate and to output information derived from the input signals;

    one or more data generating components coupled to receive the information from the one or more input components and configured to generate test signals responsive to the information; and

    one or more output components coupled to the data generating components and configured to convey the generated test signals to the integrated circuit at a second slew rate, the one or more output components being coupled to the integrated circuit in a detachable configuration, the second slew rate being faster than the first slew rate.

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