Integrated circuit testing module including signal shaping interface
First Claim
1. A system to test an integrated circuit, comprising:
- one or more input components configured to receive input signals having a first slew rate and to output information derived from the input signals;
one or more data generating components coupled to receive the information from the one or more input components and configured to generate test signals responsive to the information; and
one or more output components coupled to the data generating components and configured to convey the generated test signals to the integrated circuit at a second slew rate, the one or more output components being coupled to the integrated circuit in a detachable configuration, the second slew rate being faster than the first slew rate.
4 Assignments
0 Petitions
Accused Products
Abstract
Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test the integrated circuit at a higher slew rate than the slew rate at which signals are received from the automated testing equipment. In order to do so, the testing interface includes components configured for generating addresses, commands, and test data to be conveyed to the integrated circuit. A variety of test data patterns can be produced and the test data can be address dependent. The systems are optionally configured to include a test plan memory component configured to store one or more test plans. A test plan may include a sequence of test patterns and/or conditional branches whereby the tests to be performed next are dependent on the results of the preceding tests. The test plan memory is, optionally, be detachable from the test module.
205 Citations
27 Claims
-
1. A system to test an integrated circuit, comprising:
-
one or more input components configured to receive input signals having a first slew rate and to output information derived from the input signals; one or more data generating components coupled to receive the information from the one or more input components and configured to generate test signals responsive to the information; and one or more output components coupled to the data generating components and configured to convey the generated test signals to the integrated circuit at a second slew rate, the one or more output components being coupled to the integrated circuit in a detachable configuration, the second slew rate being faster than the first slew rate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
-
-
19. A method performed by a test module, comprising:
-
receiving signals having a first slew rate from an automated testing equipment; generating test signals within the test module responsive to the signals received from the automated testing equipment; and sending the generated test signals to an integrated circuit at a second slew rate faster than the first slew rate. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26)
-
-
27. A system comprising:
-
means for receiving signals having a first slew rate from an automated testing equipment at a test module; means for generating test signals within the test module responsive to the signals received from the automated testing equipment; and means for sending the generated test signals to an integrated circuit to be tested at a second slew rate faster than the first slew rate.
-
Specification