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Analog interferometric modulator device

  • US 8,008,736 B2
  • Filed: 06/03/2005
  • Issued: 08/30/2011
  • Est. Priority Date: 09/27/2004
  • Status: Expired due to Fees
First Claim
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1. A microelectromechanical system device comprising:

  • a first electrode layer;

    a second electrode layer, said second electrode layer being deformable;

    a support structure which separates the first electrode layer from the second electrode layer;

    a reflective element comprising a conductive layer and a reflective surface formed on the conductive layer, the reflective element being movable between a first position and a second position, the first and second positions located between the first and second electrode layers, the conductive layer electrically insulated from the first electrode layer and the second electrode layer, the reflective element spaced apart from the support structure; and

    a conductive extension electrically and mechanically connected to said conductive layer, said conductive extension passing through the second electrode layer;

    wherein the reflective element is responsive to voltages applied to the first electrode layer, the second electrode layer, and the conductive layer by moving between the first position and the second position, wherein said second electrode layer deforms as the reflective element moves between the first and second positions.

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