Disk drive expediting defect scan when quality metric exceeds a more stringent threshold

• US 8,014,094 B1
• Filed: 08/31/2009
• Issued: 09/06/2011
• Est. Priority Date: 08/31/2009
• Status: Active Grant

• Current Assignee: Western Digital Technologies Incorporated (Western Digital Corporation)
• Original Assignee: Western Digital Technologies Incorporated (Western Digital Corporation)
• Inventors: Jin, Ming
• Primary Examiner(s): Negron; Daniell L
• Assistant Examiner(s): HOLDER, REGINA NEAL
• Application Number:
  US12/551,207
• Time in Patent Office: 736 Days
• Field of Search: None
• US Class Current: 360/31
• CPC Class Codes: G11B 20/182 using test patterns
• CPC Class Codes: G11B 2220/2516 Hard disks

Abstract

A disk drive is disclosed comprising a head actuated over a disk comprising a plurality of data tracks. Data is read from one of the data tracks to generate a read signal, and a quality metric is generated in response to the read signal. When the quality metric exceeds a first threshold, a defect is detected in at least part of the data track. When the quality metric exceeds a second threshold different than the first threshold, the data track is reread to regenerate the quality metric, and when the quality metric exceeds the second threshold at least twice, the defect is detected.

Claims

1. A disk drive comprising:

a disk comprising a plurality of data tracks;

a head actuated over the disk; and

control circuitry operable to;

read data from one of the data tracks to generate a read signal;

generate a quality metric in response to the read signal;

when the quality metric exceeds a first threshold, detect a defect in at least part of the data track; and

when the quality metric exceeds a second threshold different than the first threshold;

reread the data track to regenerate the quality metric; and

when the quality metric exceeds the second threshold at least twice, detect the defect.

2. The disk drive as recited in claim 1, wherein:

the control circuitry is operable to detect the defect when the quality metric falls below the first threshold;

when the quality metric does not fall below the first threshold, the control circuitry is operable to detect the defect when the quality metric falls below the second threshold at least twice; and

the first threshold is lower than the second threshold.

3. The disk drive as recited in claim 1, wherein the control circuitry is operable to detect the defect when the quality metric exceeds the second threshold N out of M rereads, where N and M are integers.

4. The disk drive as recited in claim 1, wherein the control circuitry is operable to detect the defect when the quality metric exceeds the first threshold when rereading the data track.

5. The disk drive as recited in claim 1, wherein the control circuitry is further operable to adjust the first threshold in response to a number of defects detected by the first threshold.

6. The disk drive as recited in claim 5, wherein:

when a ratio of the number of defects detected by the first threshold to a total number of defects rises above a limit, the control circuitry is operable to adjust the first threshold to reduce a probability of detecting defects; and

when the ratio falls below a limit, the control circuitry is operable to adjust the first threshold to increase the probability of detecting defects.

7. The disk drive as recited in claim 1, wherein:

each data track comprises a plurality of data wedges defined by a plurality of servo sectors; and

the control circuitry is operable to read data from each data wedge and detect the defect in one of the data wedges.

8. A method of operating a disk drive, the disk drive comprising a head actuated over a disk comprising a plurality of data tracks, the method comprising:

reading data from one of the data tracks to generate a read signal;

generating a quality metric in response to the read signal;

when the quality metric exceeds a first threshold, detecting a defect in at least part of the data track; and

when the quality metric exceeds a second threshold different than the first threshold;

rereading the data track to regenerate the quality metric; and

when the quality metric exceeds the second threshold at least twice, detecting the defect.

9. The method as recited in claim 8, wherein:

the defect is detected when the quality metric falls below the first threshold;

when the quality metric does not fall below the first threshold, the defect is detected when the quality metric falls below the second threshold at least twice; and

the first threshold is lower than the second threshold.

10. The method as recited in claim 8, wherein the defect is detected when the quality metric exceeds the second threshold N out of M rereads, where N and M are integers.

11. The method as recited in claim 8, wherein the defect is detected when the quality metric exceeds the first threshold when rereading the data track.

12. The method as recited in claim 8, further comprising adjusting the first threshold in response to a number of defects detected by the first threshold.

13. The method as recited in claim 12, wherein:

when a ratio of the number of defects detected by the first threshold to a total number of defects rises above a limit, further comprising adjusting the first threshold to reduce a probability of detecting defects; and

when the ratio falls below a limit, further comprising adjusting the first threshold to increase the probability of detecting defects.

14. The method as recited in claim 8, wherein:

each data track comprises a plurality of data wedges defined by a plurality of servo sectors; and

further comprising reading data from each data wedge and detecting the defect in one of the data wedges.