Data recovery scan based on head performance

• US 8,023,215 B1
• Filed: 05/25/2010
• Issued: 09/20/2011
• Est. Priority Date: 05/25/2010
• Status: Expired due to Fees

• Current Assignee: Seagate Technology LLC (Seagate Technology Holdings Plc)
• Original Assignee: Seagate Technology LLC (Seagate Technology Holdings Plc)
• Inventors: Bailey, Kevin M., Burns, Kenneth R., Angelo, James E., Tadinada, Akhila, Ghaly, Mai A., Choquette, Paul J.
• Primary Examiner(s): Tzeng; Fred
• Application Number:
  US12/786,796
• Time in Patent Office: 483 Days
• Field of Search: 360/31, 360/46, 360/53, 360/55, 360/58, 360/60, 360/78.06, 711/100, 714/8, 714/42, 714/54
• US Class Current: 360/31
• CPC Class Codes: G11B 20/18 Error detection or correction; Testing , e.g. of drop-outs
• CPC Class Codes: G11B 2220/2516 Hard disks
• CPC Class Codes: G11B 27/36 Monitoring, i.e. supervising the progress of recording or reproducing for digital recording G11B20/00 and s.gr.; for monitoring, testing or measuring of TV recorders of the type covered by H04N5/76 and subgroups, see H04N17/06

Abstract

A method is provided that decides whether a region of data storage units in a data storage system should be scanned for defective data. A current region of data storage units affected by a write operation is determined and which select transducing head of the data storage system that corresponds with the current region is also determined. A scalar value that corresponds with the select transducing head is retrieved. The scalar value related to a condition of the select transducing head based on previously conducted performance tests. An incremented write count of the affected region is scaled by the scalar value to obtain a new increment write count. A defective data scan is performed on the affected region if the new increment write count exceeds a default write count threshold.

Claims

1. A method of deciding whether a region of data storage units in a data storage system should be scanned for defective data, the method comprising:

determining a current region of data storage units affected by a write operation;

determining which select transducing head of the data storage system corresponds with the current region;

retrieving a scalar value that corresponds with the select transducing head, the scalar value related to a condition of the select transducing head based on previously conducted performance tests;

scaling an incremented write count of the affected region by the scalar value to obtain a new increment write count; and

performing a defective data scan on the affected region if the new increment write count exceeds a default write count threshold.

2. The method of claim 1, further comprising resetting the new increment write count to zero after performing the defective data scan.

3. The method of claim 1, wherein retrieving a scalar value comprises retrieving an Adjacent Track Interference (ATI) scalar value that corresponds with the select transducing head, the ATI scalar value related to ATI performance of the select transducing head based on the previously conducted performance tests.

4. The method of claim 3, wherein scaling the incremented write count of the affected region comprises scaling an ATI increment write count of the affected region by the ATI scalar value to obtain a new ATI increment write count.

5. The method of claim 4, wherein retrieving a scalar value comprises retrieving a Side Track Erasure (STE) scalar value that corresponds with the select transducing head, the STE scalar value related to STE performance of the select transducing head based on the previously conducted performance tests.

6. The method of claim 5, wherein scaling the incremented write count of the affected region comprises scaling a STE increment write count of the affected region by the STE scalar value to obtain a new STE increment write count.

7. The method of claim 6, wherein prior to performing a defective data scan further comprising determining if the new ATI increment write count is greater than the new STE increment write count.

8. The method of claim 7, further comprising marking the current region, a previous region if the first unit in the current region was affected by a write operation and a next region if the last unit in the current region was affected by the write operation as a ATI scan unit.

9. The method of claim 8, wherein performing the defective data scan comprises performing the defective data scan if the new ATI increment write count is greater than the new STE increment write count and if the ATI increment write count exceeds a default need-to-scan write count threshold or a default ought-to-scan write count threshold.

10. The method of claim 7, further comprising:

retrieving a STE range value that corresponds with the select transducing head;

determining a number of regions to be scanned based on the STE range value; and

marking the regions to be scanned as a STE scan unit.

11. The method of claim 10, wherein performing the defective data scan comprises performing the defective data scan if the new STE increment write count is greater than the new ATI increment write count and if the STE increment write count exceeds a default need-to-scan write count threshold or a default ought-to-scan write count threshold.

12. A storage system that stores data in storage segments comprises processing circuitry configured to:

determine a current region of data storage units affected by a write operation;

determine which select transducing head of the data storage system corresponds with the current region;

retrieve a scalar value from memory that corresponds with the select transducing head, the scalar value related to a condition of the select transducing head based on previously conducted performance tests;

scale an incremented write count of the affected region by the scalar value to obtain a new increment write count; and

perform a defective data scan on the affected region if the new increment write count exceeds a default write count threshold.

13. The system of claim 12, wherein the processing circuitry:

retrieves an Adjacent Track Interference (ATI) scalar value that corresponds with the select transducing and relates to the ATI performance of the select transducing head based on the previously conducted performance tests; and

scales an ATI incremented write count of the affected region by the ATI scalar value to obtain a new ATI increment write count.

14. The system of claim 13, wherein the processing circuitry:

retrieves a Side Track Erasure (STE) scalar value that corresponds with the select transducing and relates to STE performance of the select transducing head based on the previously conducted performance tests; and

scales a STE incremented write count of the affected region by the STE scalar value to obtain a new STE increment write count.

15. The system of claim 14, wherein prior to the processing circuitry performing a defective data scan, the processing circuitry determines if the new ATI increment write count is greater than the new STE increment write count.

16. The system of claim 15, wherein the processing circuitry:

performs the defective data scan if the new ATI increment write count is greater than the new STE increment write count and the new ATI increment write count exceeds a default need to scan write count threshold or a default ought to scan write count threshold; and

performs the defective data scan if the new STE increment write count is greater than the new ATI increment write count and the new STE increment write count exceeds a default need-to-scan write count threshold or a default ought-to-scan write count threshold.

17. A method of deciding whether a region of data storage units in a data storage system should be scanned for defective data, the method comprising:

determining a current region of data storage units affected by a write operation;

determining which select transducing head of the data storage system corresponds with the current region;

retrieving an Adjacent Track Interference (ATI) scalar value that corresponds with the select transducing head, the ATI scalar value related to ATI performance of the select transducing head based on previously conducted performance tests;

scaling an ATI incremented write count of the affected region by the ATI scalar value to obtain a new ATI increment write count; and

performing a defective data scan on the affected region if the new ATI increment write count exceeds a default need-to-scan write count threshold or a default ought-to-scan write count threshold.

18. The method of claim 17, wherein prior to performing the defective data scan further comprising marking the current region and a previous region if the first unit in the current region was affected by a write operation as a ATI scan unit.

19. The method of claim 17, wherein prior to performing the defective data scan further comprising marking the current region and a next region if the last unit in the current region was affected by the write operation as a ATI scan unit.

20. The method of claim 17, further comprising resetting the new ATI increment write count to zero after performing the defective data scan.