Apparatus and method for testing semiconductor memory device
First Claim
1. A method for performing a background write test in the semiconductor memory device, comprising the steps of:
- a) generating at least one test command signal;
b) preparing a test path for transmitting a predetermined test voltage outputted from an external circuit to a unit cell in response to the test command signal generated at the step a) by activating a word line for performing a test operation and by coupling a local input/output (I/O) line pair to a bit line for performing the test operation;
c) supplying the predetermined test voltage to the local I/O line pair; and
d) reading stored data of the unit cell in order to compare the predetermined test voltage with the stored data of the unit cell corresponding to the test path.
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Abstract
A semiconductor memory device for performing a reliability test includes a write driving block for generating a predetermined test voltage in a test mode and delivering a data inputted from an external circuit into the local I/O line pair during a data access operation in a normal mode, a local I/O line pair coupled to the write driving block for receiving the predetermined test voltage in the test mode, and a cell array having a plurality of unit cells and a plurality of bit line pairs respectively having first and second bit lines and coupled to at least one unit cell for receiving the predetermined test voltage from each local I/O line pair to thereby check a result of the reliability test in the test mode.
21 Citations
16 Claims
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1. A method for performing a background write test in the semiconductor memory device, comprising the steps of:
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a) generating at least one test command signal; b) preparing a test path for transmitting a predetermined test voltage outputted from an external circuit to a unit cell in response to the test command signal generated at the step a) by activating a word line for performing a test operation and by coupling a local input/output (I/O) line pair to a bit line for performing the test operation; c) supplying the predetermined test voltage to the local I/O line pair; and d) reading stored data of the unit cell in order to compare the predetermined test voltage with the stored data of the unit cell corresponding to the test path. - View Dependent Claims (2, 3)
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4. A semiconductor memory device for performing a background test, comprising:
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a test decision block configured to determine a goal and a range of the background write test and to generate at least one test control signal; a test voltage generating block configured to output at least one predetermined test voltage to each data line in response to the test control signal outputted from the test decision block, wherein the test voltage generating block activates a word line for performing a test operation and couples a local input/output (I/O) line pair to a bit line for performing the test operation; and a test performing block, coupled to the test voltage generating block through each data line, configured to receive the predetermined test voltage and to compare the predetermined test voltage of each data line with stored data at each unit cell. - View Dependent Claims (5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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Specification