Digital thermal sensor test implementation without using main core voltage supply
First Claim
1. A method for calibrating digital thermal sensors in an analog voltage domain, the method comprising:
- powering test logic and a plurality of digital thermal sensors, in a processor chip, with an analog voltage and without enabling a core voltage to any remaining components in the processor chip in order to eliminate any effect of self-heating due to leakage current in the remaining components of the processor chip;
receiving, in the test logic, a clock signal;
outputting a value of a register, on each clock cycle from the clock signal, to each digital thermal sensor in the plurality of digital thermal sensors; and
for each digital thermal sensor in the plurality of digital thermal sensors;
responsive to the value of the register received in the digital thermal sensor failing to equal the temperature threshold of the digital thermal sensor, incrementing the value of the register on each clock cycle from the clock signal, wherein the value of the register is incremented by one on each clock cycle by an incrementer; and
responsive to the value of the register received in the digital thermal sensor equaling a temperature threshold of the digital thermal sensor, transitioning an output state of the digital thermal sensor, wherein the value of the register at the point of transition is used to calibrate the digital thermal sensor.
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Abstract
A method and apparatus are provided for calibrating digital thermal sensors. A processor chip with a plurality of digital thermal sensors receives an analog voltage. A test circuit coupled to the processor chip receives a clock signal and a register coupled to the test circuit outputs a value on each clock cycle to a digital thermal sensor in the plurality of digital thermal sensors. The digital thermal sensor transitions an output state in response to the value of the register received in the digital thermal sensor equaling a temperature threshold of the digital thermal sensor. The value of the register at the point of transition is used to calibrate the digital thermal sensor. An incrementer increments the value of the register on each clock cycle in response to the value of the register received in the digital thermal sensor failing to equal the temperature threshold of the digital thermal sensor.
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Citations
21 Claims
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1. A method for calibrating digital thermal sensors in an analog voltage domain, the method comprising:
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powering test logic and a plurality of digital thermal sensors, in a processor chip, with an analog voltage and without enabling a core voltage to any remaining components in the processor chip in order to eliminate any effect of self-heating due to leakage current in the remaining components of the processor chip; receiving, in the test logic, a clock signal; outputting a value of a register, on each clock cycle from the clock signal, to each digital thermal sensor in the plurality of digital thermal sensors; and for each digital thermal sensor in the plurality of digital thermal sensors; responsive to the value of the register received in the digital thermal sensor failing to equal the temperature threshold of the digital thermal sensor, incrementing the value of the register on each clock cycle from the clock signal, wherein the value of the register is incremented by one on each clock cycle by an incrementer; and responsive to the value of the register received in the digital thermal sensor equaling a temperature threshold of the digital thermal sensor, transitioning an output state of the digital thermal sensor, wherein the value of the register at the point of transition is used to calibrate the digital thermal sensor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A digital thermal sensor calibration apparatus in an analog voltage domain, the apparatus comprising:
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test circuit and a plurality of digital thermal sensors in a processor chip that are powered by an analog voltage without enabling a core voltage to any remaining components in the processor chip in order to eliminate any effect of self-heating due to leakage current in the remaining components of the processor chip, wherein the test circuit receives a clock signal; a register coupled to the test circuit outputs a value on each clock cycle from the clock signal to each digital thermal sensor in the plurality of digital thermal sensors; and for each digital thermal sensor in the plurality of digital thermal sensors; an incrementer increments the value of the register on each clock cycle from the clock signal in response to the value of the register received in the digital thermal sensor failing to equal the temperature threshold of the digital thermal sensor, wherein the value of the register is incremented by one on each clock cycle; and the digital thermal sensor transitions an output state in response to the value of the register received in the digital thermal sensor equaling a temperature threshold of the digital thermal sensor, wherein the value of the register at the point of transition is used to calibrate the digital thermal sensor. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. A computer program product comprising a non-transitory computer readable medium having a computer readable program for calibrating digital thermal sensors in an analog voltage domain, wherein the computer readable program, when executed in a data processing system, causes the data processing system to:
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receive and power test logic and a plurality of digital thermal sensors, in a processor chip, with an analog voltage and without enabling a core voltage to any remaining components in the processor chip in order to eliminate any effect of self-heating due to leakage current in the remaining components of the processor chip; receive a clock signal; output a value of a register on each clock cycle from the clock signal to each digital thermal sensor in the plurality of digital thermal sensors; and for each digital thermal sensor in the plurality of digital thermal sensors; responsive to the value of the register received in the digital thermal sensor failing to equal the temperature threshold of the digital thermal sensor, increment the value of the register on each clock cycle from the clock signal, wherein the value of the register is incremented by one on each clock cycle by an incrementer; and responsive to the value of the register received in the digital thermal sensor equaling a temperature threshold of the digital thermal sensor, transition an output state of the digital thermal sensor, wherein the value of the register at the point of transition is used to calibrate the digital thermal sensor. - View Dependent Claims (18, 19, 20, 21)
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Specification