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Methods of assessing and designing an application specific measurement system

  • US 8,027,855 B2
  • Filed: 05/30/2006
  • Issued: 09/27/2011
  • Est. Priority Date: 05/30/2006
  • Status: Active Grant
First Claim
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1. A method of assessing feasibility of a project, the method comprising:

  • receiving a datum associated with a desired process;

    designing, using one or more computers, an application specific multivariate optical computing system based on the datum, comprising;

    analyzing the datum;

    separating the datum into calibration and validation portions thereof;

    developing one or more models of at least one component of the application specific multivariate optical computing system using the calibration portion of the datum;

    and testing the one or more models using the validation portion of the datum;

    wherein the application specific multivariate optical computing system incorporates one or more of the models; and

    evaluating, using the one or more computers, a set of input parameters to determine an applicability of the application specific multivariate optical computing system to the desired process;

    wherein developing the one or more models comprises;

    modeling, using the one or more computers and the calibration portion of the datum, two or more of the following elements of the application specific multivariate optical computing system;

    an illumination source adapted to provide at least a calibration light;

    a beam splitter adapted to split the calibration light into first and second portions thereof, and further adapted to split a carrier light into first and second portions thereof;

    a baseline detector to which the respective first portions of the calibration light and the carrier light are adapted to be sent by the beam splitter;

    an element detector to which the respective second portions of the calibration light and the carrier light are adapted to be sent by the beam splitter;

    ora multivariate optical element through which the respective second portions of the calibration light and the carrier light are adapted to pass before being received by the element detector.

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