Analyte sensors and methods of use
First Claim
Patent Images
1. A sensor for determining the concentration of an analyte in a sample, the sensor comprising:
- a first substrate and a second substrate;
a spacer between the first substrate and the second substrate;
a sample chamber having a first inlet and a second inlet, the first inlet and the second inlet defined by the first substrate, second substrate, and spacer; and
a first projection extending from a first edge of the sensor proximate the first inlet, wherein the first projection is defined by the first substrate, and wherein a width of the first projection is less than a width of the inlet.
2 Assignments
0 Petitions
Accused Products
Abstract
Analyte sensors for determining the concentration of an analyte in a sample. The sensors have a sample chamber having an inlet with a projection extending from an edge of the sensor for facilitating flow of sample into the sample chamber.
-
Citations
41 Claims
-
1. A sensor for determining the concentration of an analyte in a sample, the sensor comprising:
-
a first substrate and a second substrate; a spacer between the first substrate and the second substrate; a sample chamber having a first inlet and a second inlet, the first inlet and the second inlet defined by the first substrate, second substrate, and spacer; and a first projection extending from a first edge of the sensor proximate the first inlet, wherein the first projection is defined by the first substrate, and wherein a width of the first projection is less than a width of the inlet. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
-
-
12. A sensor for determining the concentration of an analyte in a sample, the sensor comprising:
-
a first substrate and a second substrate; a spacer between the first substrate and the second substrate; and a sample chamber between the first substrate and the second substrate, wherein the sample chamber is bounded by the spacer, and wherein the sample chamber includes a first inlet and a second inlet; a first projection extending from the first substrate at the first inlet; and a second projection extending from the first substrate at the second inlet. - View Dependent Claims (13, 14, 15, 16)
-
-
17. A sensor for determining the concentration of an analyte in a sample, the sensor comprising:
-
a first substrate and a second substrate; a first side edge, a second side edge and an end edge; a sample chamber defined between the first substrate and the second substrate, the sample chamber extending from the first side edge to the second side edge; a first aperture between the first substrate and the second substrate at the first side edge; a second aperture between the first substrate and the second substrate at the second side edge; and a first projection extending from the first side edge proximate the first aperture. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25)
-
-
26. A method of analyzing an analyte concentration in a sample, comprising:
-
contacting a sample with a sensor, the sensor comprising; a first substrate and a second substrate; a spacer between the first substrate and the second substrate; a sample chamber between the first substrate and the second substrate, wherein the sample chamber is bounded by the spacer, and wherein the sample chamber includes a first inlet and a second inlet; a first projection extending from the first substrate at the first inlet; and a second projection extending from the first substrate at the second inlet; transferring the sample into the sample chamber through the first inlet, wherein the first inlet is bounded by the first substrate, the second substrate, and the first projection; and determining the concentration of the analyte in the sample. - View Dependent Claims (27, 28, 29, 30, 31, 32, 33)
-
-
34. A method of analyzing an analyte concentration in a sample, comprising:
-
contacting a sample with a sensor, the sensor comprising; a first substrate and a second substrate; a spacer between the first substrate and the second substrate; a sample chamber having a first inlet and a second inlet, the first inlet and the second inlet defined by the first substrate, second substrate, and spacer; and a first projection extending from a first edge of the sensor proximate the first inlet, wherein the first projection is defined by the first substrate, and wherein a width of the first projection is less than a width of the inlet; transferring the sample into the sample chamber through the first inlet, wherein the first inlet is bounded by the first substrate, the second substrate, and the first projection; and determining the concentration of the analyte in the sample. - View Dependent Claims (35, 36, 37, 38, 39, 40, 41)
-
Specification