Method for determining the surface quality of a substrate and associated machine for converting the substrate

• US 8,045,147 B2
• Filed: 09/02/2008
• Issued: 10/25/2011
• Est. Priority Date: 09/21/2007
• Status: Active Grant

• Current Assignee: Bobst SA (JBF Finance SA)
• Original Assignee: Bobst SA (JBF Finance SA)
• Inventors: Alonso, Jeronimo, Toma, Claude
• Primary Examiner(s): Ton; Tri T
• Application Number:
  US12/202,731
• Publication Number:
  US 20090079971A1
• Time in Patent Office: 1,148 Days
• Field of Search: 3562371-2375, 226/45, 226/20, 101/484
• US Class Current: 356/237.2
• CPC Class Codes: G01N 21/89 in moving material, e.g. running paper or textiles G01N21/90, G01N21/91, G01N21/94 take precedence

Abstract

A method for determining the surface quality of a substrate passing from an initial state into a converted state during a conversion process including the steps of acquiring first information relating to surface defects detected on the initial substrate, acquiring second information relating to surface defects detected on the converted substrate, of processing the first information and the second information, and of classifying the converted substrate as a function of the first acquired information relating to the surface defects detected on the initial substrate and as a function of the second acquired information relating to the surface defects detected on the converted substrate.

Claims

1. A method for determining the surface quality of a substrate passing from an initial state of an initial substrate into a converted state of a converted substrate during a conversion process in a substrate-converting machine in a packaging production line, the method comprising the steps of:

prior to performing the conversion process of the initial substrate in the substrate-converting machine in the packaging production line, acquiring first information relating to surface defects detected on the initial substrate,

after performing the conversion process of the initial substrate in the substrate-converting machine, acquiring second information relating to surface defects detected on the converted substrate,

processing the first information and the second information by a processing unit, and

classifying the converted substrate by the processing unit as a function of the first acquired information relating to the surface defects detected on the initial substrate and as a function of the second acquired information relating to the surface defects detected on the converted substrate, wherein the classifying distinguishes the surface defects detected on the initial substrate from the surface defects detected on the converted substrate.

2. The method according to claim 1, further comprising the steps following the conversion process of:

detecting the surface defects on the converted substrate and creating second information relating to the surface defects on the converted substrate.

3. The method according to claim 2, wherein the additional steps following the conversion process, of detecting the surface defects on the converted substrate and of generating second information, are implemented by a user of the converted substrate.

4. The method according to claim 1, further comprising two additional steps, preceding the conversion process, of detecting the surface defects on the initial substrate and of creating first information relating to said surface defects on said initial substrate.

5. The method according to claim 4, wherein the two additional steps preceding the conversion process, of detecting the surface defects on the initial substrate and of generating first information, are implemented by a manufacturer of the initial substrate.

6. The method according to claim 1, further comprising an additional step, following the step of classifying the converted substrate, of marking all or part of the converted substrate identifying at least one of the surface defects detected on the initial substrate and the surface defects detected on the converted substrate.

7. The method according to claim 1, further comprising an additional step, following the step of classifying the converted substrate, of ejecting all or part of the converted substrate.

8. The method according to claim 2, further comprising acquiring the first information relating to surface defects detected on the initial substrate and the second information relating to surface defects detected on the converted substrate from a front side and a reverse side of the initial substrate and of the converted substrate.

9. A converting machine for converting an initial substrate and obtaining a converted substrate in a packaging production line, comprising:

at least one element for converting the initial substrate,

a first device for detecting surface defects on said initial substrate and acquiring first information relating to the surface defects detected on the initial substrate, the first device being placed upstream of the at least one converting element in a path of the substrate through conversion in the packaging production line,

a second device for detecting surface defects on the converted substrate and acquiring second information relating to the surface defects detected on the converted substrate, the second device being placed downstream of the at least one converting element, and

a unit operable for processing the first information and the second information and classifying the converted substrate as a function of the acquired information relating to the surface defects detected on the initial substrate in a path of the substrate through conversion and as a function of the acquired information relating to the surface defects detected on the converted substrate, wherein the classifying distinguishes the surface defects detected on the initial substrate from the surface defects detected on the converted substrate.

10. The machine according to claim 9, wherein the first device for detecting surface defects on the initial substrate and the second device for detecting surface defects on the converted substrate comprise a viewing system provided with an illuminating device operable for illuminating the substrate.