3T high density nvDRAM cell
First Claim
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1. A memory circuit comprising:
- a single transistor storing both volatile and nonvolatile bit charges;
wherein the volatile bit charge storage is accomplished via gate-to-bulk capacitances and source-to-drain capacitances of the single transistor.
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Abstract
A memory circuit includes a single transistor storing both volatile and nonvolatile bit charges.
128 Citations
21 Claims
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1. A memory circuit comprising:
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a single transistor storing both volatile and nonvolatile bit charges; wherein the volatile bit charge storage is accomplished via gate-to-bulk capacitances and source-to-drain capacitances of the single transistor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of operating a combined volatile and nonvolatile memory circuit, comprising:
causing a first charge representing a nonvolatile bit to be stored in a charge trapping region of a transistor, and causing a second charge representing a volatile bit to be stored via gate-to-bulk capacitances and source-to-drain capacitances of the transistor. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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19. A device comprising:
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a processor coupled to interact with a memory system, the memory system comprising; an array of memory cells each storing a single volatile bit and a single nonvolatile bit, each cell employing a single transistor to store the volatile bit and to store the nonvolatile bit; wherein the volatile bit charge storage is accomplished via gate-to-bulk capacitances and source-to-drain capacitances of the single transistor. - View Dependent Claims (20, 21)
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Specification