Multi-source sensor for three-dimensional imaging using phased structured light
First Claim
1. A system for sensing a three-dimensional topology of a test surface, the system comprising:
- a first illumination source configured to generate first patterned illumination from a first point of view;
a second illumination source configured to generate second patterned illumination from a second point of view, the second point of view differing from the first point of view;
an area array image detector configured to simultaneously acquire at least first and second fringe images relative to the first and second patterned illuminations; and
a controller coupled to the first and second sources and to the detector, the controller being configured to generate a height topology of the test surface based on images acquired while the first and second patterned illuminators are energized.
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Abstract
A system for sensing a three-dimensional topology of a test surface is provided. A first illumination source generates first patterned illumination from a first point of view. A second illumination source generates second patterned illumination from a second point of view, the second point of view differing from the first point of view. An area array image detector simultaneously acquires at least first and second fringe images relative to the first and second patterned illuminations. A controller is coupled to the first and second sources and to the detector. The controller generates a height topology of the test surface based on images acquired while the first and second patterned illuminators are energized.
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Citations
14 Claims
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1. A system for sensing a three-dimensional topology of a test surface, the system comprising:
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a first illumination source configured to generate first patterned illumination from a first point of view; a second illumination source configured to generate second patterned illumination from a second point of view, the second point of view differing from the first point of view; an area array image detector configured to simultaneously acquire at least first and second fringe images relative to the first and second patterned illuminations; and a controller coupled to the first and second sources and to the detector, the controller being configured to generate a height topology of the test surface based on images acquired while the first and second patterned illuminators are energized. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of three-dimensionally mapping an image of a test surface, the method comprising:
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projecting a first fringe image onto the test surface from a first point of view; projecting a second fringe image onto the test surface from a second point of view different from the first point of view; capturing a first plurality of fringe phase images of the test surface while the first and second patterned illuminations are disposed upon the test surface, wherein relative movement between the test surface and the fringe images results in a displacement between each fringe phase image capture that is a fraction of a fringe period; causing relative displacement between the test surface and the fringe images to an extent equal to a size of one of the first and second fringe images in a scan direction; capturing a second plurality of fringe phase images of the test surface while the first and second patterned illuminations are disposed upon the test surface, wherein relative movement between the test surface and the fringe images results in a displacement between each fringe phase image capture that is a fraction of a fringe period; and computing a height map based upon the first and second plurality of fringe phase images. - View Dependent Claims (13, 14)
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Specification