Autonomous adaptive system and method for improving semiconductor manufacturing quality
First Claim
1. A semiconductor tool system, comprising:
- a processor;
a computer-readable storage medium communicatively coupled to the processor and storing computer executable components comprising;
a learning system configured to;
receive data that pertains to a set of tools utilized to fabricate a product; and
backward chain through the data to rank at least one tool in the set of tools in accord with degradation of the product to generate knowledge to facilitate an increase in product yield.
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Abstract
An autonomous biologically based learning tool system and a method that the tool system employs for learning and analysis are provided. The autonomous biologically based learning tool system includes (a) one or more tool systems that perform a set of specific tasks or processes and generate assets and data related to the assets that characterize the various processes and associated tool performance; (b) an interaction manager that receives and formats the data, and (c) an autonomous learning system based on biological principles of learning. The autonomous learning system comprises a memory platform and a processing platform that communicate through a network. The network receives data from the tool system and from an external actor through the interaction manager. Both the memory platform and the processing platform include functional components and memories that can be defined recursively. Similarly, the one or more tools can be deployed recursively, in a bottom-up manner in which an individual autonomous tools is assembled in conjunction with other (disparate or alike) autonomous tools to form an autonomous group tool, which in turn can be assembled with other group tools to form a conglomerated autonomous tool system. Knowledge generated and accumulated in the autonomous learning system(s) associated with individual, group and conglomerated tools can be cast into semantic networks that can be employed for learning and driving tool goals based on context.
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Citations
30 Claims
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1. A semiconductor tool system, comprising:
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a processor; a computer-readable storage medium communicatively coupled to the processor and storing computer executable components comprising; a learning system configured to; receive data that pertains to a set of tools utilized to fabricate a product; and backward chain through the data to rank at least one tool in the set of tools in accord with degradation of the product to generate knowledge to facilitate an increase in product yield. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29)
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14. A method comprising:
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receiving data pertaining to quality of a product, wherein the data is further associated with a plurality of tools involved in fabricating the product; identifying, by backward chaining through the data, degradation in the quality of the product; and ranking at least one tool, in the plurality of tools, regarding an effect of the at least one tool on the quality of the product. - View Dependent Claims (15, 16, 17)
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18. A computer-readable storage medium having computer executable instructions stored thereon that, in response to execution by a processor, cause the processor to perform operations for semiconductor processing, the operations comprising:
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receiving data pertaining to quality of a product, wherein the data is further associated with a plurality of tools involved in fabricating the product; and generating a knowledge facilitating an increase in product yield, wherein the generating further comprises; identifying, by backward chaining through the data, degradation in quality of the product; and ranking at least one tool, in the plurality of tools, regarding an effect of the at least one tool on the quality of the product.
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30. A semiconductor tool system, comprising:
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a processor; a computer-readable storage medium communicatively coupled to the processor and storing computer executable components comprising; a learning system configured to; receive data that pertains to a set of tools utilized to fabricate a product; and backward chain, in the event of degradation in the quality of the product, through the data to rank at least one tool in the set of tools to generate knowledge to facilitate an increase in efficiency of the semiconductor tool system.
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Specification