Sample processing device compression systems and methods
First Claim
1. A system for processing sample processing devices, the system comprising:
- a base plate operatively coupled to a drive system, wherein the drive system rotates the base plate about a rotation axis, wherein the rotation axis defines a z-axis;
thermal structure operatively attached to the base plate, wherein the thermal structure comprises a transfer surface exposed proximate a first surface of the base plate;
a cover facing the transfer surface, wherein the cover comprises an inner compression ring and an outer compression ring;
a sample processing device adapted to be located between the cover and the base plate, a portion of the sample processing device comprising a plurality of process chambers;
compression structure operatively attached to the cover to force the cover in a first direction along the z-axis towards the transfer surface, wherein the inner and outer compression rings contact and urge the portion of the sample processing device into contact with the transfer surface;
one or more resilient members operatively coupled to one or both of the cover and thermal structure, wherein the one or more resilient members provide a biasing force opposing the force of the compression structure forcing the cover towards the base plate; and
an energy source adapted to deliver thermal energy to the thermal structure while the base plate is rotating about the rotation axis.
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Accused Products
Abstract
Sample processing systems and methods of using those systems for processing sample materials located in sample processing devices are disclosed. The sample processing systems include a rotating base plate on which the sample processing devices are located during operation of the systems. The systems also include a cover and compression structure designed to force a sample processing device towards the base plate. The preferred result is that the sample processing device is forced into contact with a thermal structure on the base plate. The systems and methods of the present invention may include one or more of the following features to enhance thermal coupling between the thermal structure and the sample processing device: a shaped transfer surface, magnetic compression structure, and floating or resiliently mounted thermal structure. The methods may preferably involve deformation of a portion of a sample processing device to conform to a shaped transfer surface.
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Citations
24 Claims
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1. A system for processing sample processing devices, the system comprising:
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a base plate operatively coupled to a drive system, wherein the drive system rotates the base plate about a rotation axis, wherein the rotation axis defines a z-axis; thermal structure operatively attached to the base plate, wherein the thermal structure comprises a transfer surface exposed proximate a first surface of the base plate; a cover facing the transfer surface, wherein the cover comprises an inner compression ring and an outer compression ring; a sample processing device adapted to be located between the cover and the base plate, a portion of the sample processing device comprising a plurality of process chambers; compression structure operatively attached to the cover to force the cover in a first direction along the z-axis towards the transfer surface, wherein the inner and outer compression rings contact and urge the portion of the sample processing device into contact with the transfer surface; one or more resilient members operatively coupled to one or both of the cover and thermal structure, wherein the one or more resilient members provide a biasing force opposing the force of the compression structure forcing the cover towards the base plate; and an energy source adapted to deliver thermal energy to the thermal structure while the base plate is rotating about the rotation axis. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A system for processing sample processing devices, the system comprising:
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a base plate operatively coupled to a drive system, wherein the drive system rotates the base plate about a rotation axis, wherein the rotation axis defines a z-axis; thermal structure operatively attached to the base plate, wherein the thermal structure comprises a transfer surface exposed proximate a first surface of the base plate; a cover facing the transfer surface; a sample processing device adapted to be located between the cover and the base plate, a portion of the sample processing device comprising a plurality of process chambers; one or more magnetic elements operatively attached to the cover and base plate, wherein magnetic attraction between the one or more magnetic elements attached to the cover and the base plate draw the cover in a first direction along the z-axis towards the first surface of the base plate such that the portion of the sample processing device is urged into contact with the thermal structure of the base plate; one or more resilient members operatively coupled to one or both of the cover and thermal structure, wherein the one or more resilient members provide a biasing force opposing the magnetic attraction drawing the cover towards the first surface of the base plate; and an energy source adapted to deliver thermal energy to the thermal structure while the base plate is rotating about the rotation axis. - View Dependent Claims (16, 17, 18, 19, 20)
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21. A system for processing sample processing devices, the system comprising:
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a base plate operatively coupled to a drive system, wherein the drive system rotates the base plate about a rotation axis; a cover facing a first surface of the base plate; compression structure operatively attached to the cover to force the cover towards the base plate; thermal structure operatively attached to the base plate; a sample processing device adapted to be located between the cover and the base plate, a portion of the sample processing device comprising a plurality of process chambers; one or more resilient members operatively coupling the thermal structure to the base plate, wherein the one or more resilient members provide a biasing force opposing the force of the compression structure forcing the cover towards the base plate, wherein the portion of the sample processing device is urged into contact with the thermal structure; and an energy source adapted to deliver thermal energy to the thermal structure while the base plate is rotating about the rotation axis. - View Dependent Claims (22, 23)
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24. A system for processing sample processing devices, the system comprising:
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a base plate operatively coupled to a drive system, wherein the drive system rotates the base plate about a rotation axis, wherein the rotation axis defines a z-axis; thermal structure operatively attached to the base plate, wherein the thermal structure comprises a transfer surface exposed proximate a first surface of the base plate, wherein the exposed transfer surface is in the form of an annular ring that comprises an inner edge and an outer edge proximate the first surface of the base plate, wherein the outer edge of the transfer surface is offset in the first direction along the z-axis relative to the inner edge of the transfer surface; a cover facing the transfer surface, wherein the cover comprises an inner compression ring and an outer compression ring; a sample processing device adapted to be located between the cover and the base plate, a portion of the sample processing device comprising a plurality of process chambers; compression structure operatively attached to the cover to force the cover in a first direction along the z-axis towards the transfer surface, wherein the inner and outer compression rings contact and urge the portion of the sample processing device into contact with the transfer surface; and an energy source adapted to deliver thermal energy to the thermal structure while the base plate is rotating about the rotation axis.
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Specification