Semiconductor device manufacturing method and silicon oxide film forming method
First Claim
1. A semiconductor device manufacturing method comprising:
- forming an element isolation trench in a semiconductor substrate;
forming a silicon compound film in insides of the element isolation trench in order to embed the element isolation trench before a first oxidation process;
conducting the first oxidation process to reform a surface of the silicon compound film; and
conducting a second oxidation process to form a coated silicon oxide film from the silicon compound film,wherein the first oxidation process at a first temperature reforms the surface of the silicon compound film to a volatile matter emission preventing layer which permits passage of an oxidizing agent and impurities and which does not permit passage of a volatile matter containing silicon atoms; and
wherein the second oxidation process is conducted at a second temperature which is higher than the first temperature.
5 Assignments
0 Petitions
Accused Products
Abstract
A semiconductor device manufacturing method has forming element isolation trenches in a semiconductor substrate, forming a silicon compound film in insides of the element isolation trenches in order to embed the element isolation trenches, conducting a first oxidation processing at a first temperature to reform a surface of the silicon compound film to a volatile matter emission preventing layer which permits passage of an oxidizing agent and impurities and which does not permit passage of a volatile matter containing silicon atoms, and conducting a second oxidation processing at a second temperature which is higher than the first temperature to form a coated silicon oxide film inside the element isolation trenches.
-
Citations
15 Claims
-
1. A semiconductor device manufacturing method comprising:
-
forming an element isolation trench in a semiconductor substrate; forming a silicon compound film in insides of the element isolation trench in order to embed the element isolation trench before a first oxidation process; conducting the first oxidation process to reform a surface of the silicon compound film; and conducting a second oxidation process to form a coated silicon oxide film from the silicon compound film, wherein the first oxidation process at a first temperature reforms the surface of the silicon compound film to a volatile matter emission preventing layer which permits passage of an oxidizing agent and impurities and which does not permit passage of a volatile matter containing silicon atoms; and wherein the second oxidation process is conducted at a second temperature which is higher than the first temperature. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
-
Specification