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Method for a bin ratio forecast at new tape out stage

  • US 8,082,055 B2
  • Filed: 07/08/2009
  • Issued: 12/20/2011
  • Est. Priority Date: 07/08/2009
  • Status: Expired due to Fees
First Claim
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1. A method comprising:

  • collecting historical data from a plurality of processed wafers lots;

    collecting measurement data from one or more skew wafer lots;

    generating an estimated baseline distribution from the collected historical data and collected measurement data;

    generating an estimated performance distribution from the estimated baseline distribution based on one or more specified parameters and;

    determining a bin ratio forecast by applying a bin definition and a yield degradation factor estimation to the estimated performance distribution;

    determining one or more production targets based on the bin ratio forecast;

    providing fabrication resources according to the one or more production target; and

    processing a plurality of wafers based on the one or more determined production targets.

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