Environmental system including vacuum scavenge for an immersion lithography apparatus
First Claim
1. A lithographic projection method comprising:
- filling a space between a projection system and a surface of a substrate with a liquid during exposure of the substrate using a liquid confinement member which is positioned adjacent a final surface of the projection system;
projecting an image onto the substrate by the projection system during the exposure;
supplying a gas from an inlet of the liquid confinement member, the inlet being arranged to oppose the surface of the substrate during the exposure; and
removing fluid via an outlet of the liquid confinement member, that is located further outward from the space than is the inlet, the outlet being arranged to oppose the surface of the substrate during the exposure.
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Accused Products
Abstract
A lithographic projection apparatus includes a liquid confinement structure extending along at least a part of a boundary of a space between a projection system and a substrate table, the space having a cross-sectional area smaller than the area of the substrate. The liquid confinement structure includes a first inlet to supply liquid, through which the patterned beam is projected, to the space, a first outlet to remove liquid after the liquid has passed under the projection system, a second inlet formed in a face of the structure, the face arranged to oppose a surface of the substrate, and located radially outward, with respect to an optical axis of the projection system, of the space to supply gas, and a second outlet formed in the face and located radially outward, with respect to an optical axis of the projection system, of the second inlet to remove gas.
185 Citations
40 Claims
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1. A lithographic projection method comprising:
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filling a space between a projection system and a surface of a substrate with a liquid during exposure of the substrate using a liquid confinement member which is positioned adjacent a final surface of the projection system; projecting an image onto the substrate by the projection system during the exposure; supplying a gas from an inlet of the liquid confinement member, the inlet being arranged to oppose the surface of the substrate during the exposure; and removing fluid via an outlet of the liquid confinement member, that is located further outward from the space than is the inlet, the outlet being arranged to oppose the surface of the substrate during the exposure. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A method used in a liquid immersion lithography system, the method comprising:
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containing liquid using a liquid confinement member of the liquid immersion lithography system in a space between a lens of the liquid immersion lithography system and a surface of an object which is moved below the lens and the liquid confinement member; supplying a gas from an inlet of the liquid confinement member, the inlet being arranged to oppose the surface of the object, and removing fluid via an outlet of the liquid confinement member, that is located further outward from the space than is the inlet, the outlet being arranged to oppose the surface of the object. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40)
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Specification