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Electrical characterization of interferometric modulators

  • US 8,094,366 B2
  • Filed: 08/26/2010
  • Issued: 01/10/2012
  • Est. Priority Date: 09/27/2004
  • Status: Expired due to Fees
First Claim
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1. A method of conditioning a microelectromechanical device, the method comprising:

  • applying a conditioning signal to a microelectromechanical device having an offset voltage of a first value, the conditioning signal having an average of a second value, wherein the second value is based, at least in part, on the first value.

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