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Millimeter and sub-millimeter wave portal

  • US 8,098,185 B2
  • Filed: 02/12/2007
  • Issued: 01/17/2012
  • Est. Priority Date: 11/13/2006
  • Status: Expired due to Fees
First Claim
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1. A millimeter or sub-millimeter wave portal system comprising an electrooptic source, a millimeter or sub-millimeter wave detector and a data analysis unit, wherein the structure of the portal is such that at least the following conditions apply:

  • the electrooptic source comprises an optical signal generator, optical circuitry, and an optical/electrical converter;

    the optical signal generator is configured to generate a modulated optical signal characterized by a modulation frequency of at least about 30 GHz;

    the optical circuitry is configured to direct the modulated optical signal to the optical/electrical converter;

    the optical/electrical converter is configured to convert the modulated optical signal to a first millimeter or sub-millimeter wave having a first frequency and direct the first millimeter or sub-millimeter wave in the direction of an object positioned within a field-of-view defined by the millimeter or sub-millimeter wave detector;

    the millimeter or sub-millimeter wave detector is configured to convert reflections of the first millimeter or sub-millimeter wave from the object to first signals representing attenuation of the first millimeter or sub-millimeter wave upon reflection from the object;

    the optical/electrical converter is configured to convert the modulated optical signal to a second millimeter or sub-millimeter wave having a second frequency and direct the second millimeter or sub-millimeter wave in the direction of the object positioned within the field-of-view defined by the millimeter or sub-millimeter wave detector;

    the millimeter or sub-millimeter wave detector is configured to convert reflections of the second millimeter or sub-millimeter wave from the object to second signals representing attenuation of the second millimeter or sub-millimeter wave upon reflection from the object; and

    the data analysis unit transforms the first signals into an expected image of the object at the second frequency and the second signal into a measured image at the second frequency, and compares the expected image to the measured image to determine a deviation.

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