Method of teaching eyepoints for wire bonding and related semiconductor processing operations
First Claim
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1. A method of teaching an eyepoint for a wire bonding operation, the method comprising the steps of:
- (1) selecting a group of shapes from a region of a semiconductor device for use as an eyepoint, the group of shapes including at least one of (a) bond pad shapes, (b) fiducial shapes, and (c) circuitry shapes;
(2) teaching the eyepoint to a wire bonding machine using at least one of (a) a sample semiconductor device, or (b) predetermined data related to the semiconductor device, the teaching step including defining locations of each of the shapes with respect to one another to bind the selected shapes together as the eyepoint;
(3) scanning a region of another semiconductor device using a vision system of a wire bonding machine to locate a feature of the another semiconductor device corresponding to the taught eyepoint; and
(4) assigning a score to the another semiconductor device by comparing the taught eyepoint to the feature located at the scanned region.
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Abstract
A method of teaching an eyepoint for a wire bonding operation is provided. The method includes (1) selecting a group of shapes from a region of a semiconductor device for use as an eyepoint, and (2) teaching the eyepoint to a wire bonding machine using at least one of (a) a sample semiconductor device, or (b) predetermined data related to the semiconductor device. The teaching step includes defining locations of each of the shapes with respect to one another.
16 Citations
20 Claims
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1. A method of teaching an eyepoint for a wire bonding operation, the method comprising the steps of:
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(1) selecting a group of shapes from a region of a semiconductor device for use as an eyepoint, the group of shapes including at least one of (a) bond pad shapes, (b) fiducial shapes, and (c) circuitry shapes; (2) teaching the eyepoint to a wire bonding machine using at least one of (a) a sample semiconductor device, or (b) predetermined data related to the semiconductor device, the teaching step including defining locations of each of the shapes with respect to one another to bind the selected shapes together as the eyepoint; (3) scanning a region of another semiconductor device using a vision system of a wire bonding machine to locate a feature of the another semiconductor device corresponding to the taught eyepoint; and (4) assigning a score to the another semiconductor device by comparing the taught eyepoint to the feature located at the scanned region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of operating a wire bonding machine, the method comprising the steps of:
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(1) selecting a group of shapes from a region of a semiconductor device for use as an eyepoint, the group of shapes including at least one of (a) bond pad shapes, (b) fiducial shapes, and (c) circuitry shapes; (2) teaching the eyepoint to the wire bonding machine using at least one of (a) a sample semiconductor device, or (b) predetermined data related to the semiconductor device, the teaching step including defining locations of each of the shapes with respect to one another to bind the selected shapes together as the evepoint; (3) indexing another semiconductor device configured to be wire bonded into a predetermined position of the wire bonding machine; (4) scanning selected portions of the first another semiconductor device using a vision system of the wire bonding machine to locate a feature of the another semiconductor device corresponding to the taught eyepoint; and (5) assigning a score to the another semiconductor device by comparing the taught evepoint to the scanned feature. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification