Apparatus for testing multiple conductor wiring and terminations for electronic systems
First Claim
1. An apparatus for testing a system, the apparatus comprising:
- a plurality of inputs each adapted to receive a signal from a test point in the system under test;
a switching module including;
a first output selectively coupled to receive and output one or more of the plurality of inputs; and
a set of outputs excluding the first output and corresponding in number to the plurality of inputs, each of the outputs in the set of outputs being selectively coupled to receive and output a corresponding one of the plurality of inputs;
a neural network coupled to the set of outputs of the switching module, the neural network configured to measure electrical characteristics of each of the test points of the system under test at the same time when the set of outputs is selectively coupled to output the plurality of inputs to the neural network; and
a test meter coupled to the first output of the switching module such that the test meter can measure electrical characteristics of the test points when the first output is selectively coupled to output the one or more of the plurality of inputs to the test meter;
wherein when the first output is selectively coupled to output the one or more of the plurality of inputs to the test meter, the switching module is configured to sequentially couple one or more combinations of test points of the system under test to the test meter such that electrical characteristics of a first test point of the combination of test points relative to one or more other test points of the combination of test points is determined.
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Accused Products
Abstract
An apparatus for testing connections in a system has a plurality of inputs each adapted to couple to a test point in the system under test and a switching module. The switching module includes a first output selectively coupled to receive a first group of one or more of the inputs and a set of outputs corresponding in number to the plurality of inputs, each being selectively coupled to receive a corresponding one of the plurality of inputs. The apparatus may also include a meter coupled to the first switching module output and an array of nodes coupled to the set of switching module outputs, where each node couples a signal to a row sense line and a column sense line.
13 Citations
24 Claims
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1. An apparatus for testing a system, the apparatus comprising:
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a plurality of inputs each adapted to receive a signal from a test point in the system under test; a switching module including; a first output selectively coupled to receive and output one or more of the plurality of inputs; and a set of outputs excluding the first output and corresponding in number to the plurality of inputs, each of the outputs in the set of outputs being selectively coupled to receive and output a corresponding one of the plurality of inputs; a neural network coupled to the set of outputs of the switching module, the neural network configured to measure electrical characteristics of each of the test points of the system under test at the same time when the set of outputs is selectively coupled to output the plurality of inputs to the neural network; and a test meter coupled to the first output of the switching module such that the test meter can measure electrical characteristics of the test points when the first output is selectively coupled to output the one or more of the plurality of inputs to the test meter; wherein when the first output is selectively coupled to output the one or more of the plurality of inputs to the test meter, the switching module is configured to sequentially couple one or more combinations of test points of the system under test to the test meter such that electrical characteristics of a first test point of the combination of test points relative to one or more other test points of the combination of test points is determined. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. An apparatus for testing a system, the apparatus comprising:
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at least one row sense line and at least one column sense line; an array of nodes each receiving a signal from the system under test, wherein each node is electrically coupled to a specific test pin and a switch specific to the node, the nodal switch being electrically coupled to the specific test pin, each of the nodal switches being configured to selectively couple a signal that is alternative to the system under test signal received at the corresponding node to the at least one row sense line and the at least one column sense line; a circuit coupled to the at least one row sense line and configured to detect the signal coupled to the row sense line; and a circuit coupled to the at least one column sense line and configured to detect the signal coupled to the column sense line. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. An apparatus for testing a system, the apparatus comprising:
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a testing module configured to couple to a plurality of test points on the system under test and to carry out test procedures in accordance with a testing mode to generate test results; and a processor communicatively coupled to the testing module and configured to control a testing mode of the testing module and to receive the test results, wherein the processor is further configured to control a display to show a graphical representation of locations of the plurality of test points relative to each other and a graphical representation of the test results overlaid on the graphical representation of test point locations such that a user can visually identify test points associated with the test results, wherein the processor is further configured to display a logarithmically scaled view of test results corresponding to a subset of the test points along a time axis. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24)
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Specification