Method and apparatus for verifying two dimensional mark quality
First Claim
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1. A method for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method comprising the steps of:
- positioning a component with a first surface in a first position at a first station;
applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset;
obtaining an image of the applied two dimensional mark while the component remains in the first position at the first station;
performing a mark quality assessment on the mark in the obtained image; and
performing a secondary function as a result of the mark quality assessment.
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Abstract
A method and system for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method including the steps of positioning a component with a first surface at a first station, applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset, obtaining an image of the applied two dimensional mark at the first station, performing a mark quality assessment on the obtained image and performing a secondary function as a result of the mark quality assessment.
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Citations
26 Claims
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1. A method for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method comprising the steps of:
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positioning a component with a first surface in a first position at a first station; applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset; obtaining an image of the applied two dimensional mark while the component remains in the first position at the first station; performing a mark quality assessment on the mark in the obtained image; and performing a secondary function as a result of the mark quality assessment. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A method for assessing quality of a two dimensional mark that is applied to a first surface, the method comprising the steps of:
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obtaining an image of the applied two dimensional mark; decoding the mark in the obtained image to generate a first information subset wherein the first information subset includes the actual information coded by the mark; using the first information subset to generate a synthetic mark model; comparing the synthetic mark model to the mark in the obtained image to generate a difference map; using the difference map to at least in part compensate for at least one irregularity in the mark in the obtained image thereby generating a compensated mark; and assessing, with a processor, the quality of the compensated mark. - View Dependent Claims (21, 22, 23)
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24. A method for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method comprising the steps of:
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positioning a component with a first surface in a first position at a first station;
applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset;obtaining an image of the applied two dimensional mark while the component remains in the first position at the first station; performing, with a processor, a mark quality assessment on the mark in the obtained image; and providing a signal to an external device. - View Dependent Claims (25, 26)
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Specification