×

Method and system for surface analysis and envelope generation

  • US 8,108,187 B2
  • Filed: 01/08/2008
  • Issued: 01/31/2012
  • Est. Priority Date: 01/08/2008
  • Status: Expired due to Fees
First Claim
Patent Images

1. A method of surface analysis, comprising:

  • establishing a first reference point on each one of a plurality of input surfaces, said plurality of input surfaces comprising input data;

    transforming said input data to orient said input surfaces relative to said first reference point establishing an origin;

    generating a plurality of rays extending from said origin;

    calculating intersections of said plurality of rays with said input surfaces, wherein each of said rays intersects a plurality of said input surfaces;

    calculating distances from said origin to said intersections;

    calculating percentiles based on said intersections along each of said plurality of rays; and

    generating a surface using said percentiles.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×