Method and apparatus for selectively compacting test responses

• US 8,108,743 B2
• Filed: 09/27/2010
• Issued: 01/31/2012
• Est. Priority Date: 11/23/1999
• Status: Expired due to Fees

• Current Assignee: Siemens Industry Software Inc. (Siemens AG)
• Original Assignee: Mentor Graphics Corporation (Siemens AG)
• Inventors: Rajski, Janusz, Tyszer, Jerzy, Kassab, Mark, Mukherjee, Nilanjan
• Primary Examiner(s): BRITT, CYNTHIA H
• Application Number:
  US12/891,498
• Publication Number:
  US 20110138242A1
• Time in Patent Office: 491 Days
• Field of Search: 714/726, 714/729, 714/732
• US Class Current: 714/732
• CPC Class Codes: G01R 31/318547 Data generators or compressors

Abstract

A method and apparatus to compact test responses containing unknown values or multiple fault effects in a deterministic test environment. The proposed selective compactor employs a linear compactor with selection circuitry for selectively passing test responses to the compactor. In one embodiment, gating logic is controlled by a control register, a decoder, and flag registers. This circuitry, in conjunction with any conventional parallel test-response compaction scheme, allows control circuitry to selectively enable serial outputs of desired scan chains to be fed into a parallel compactor at a particular clock rate. A first flag register determines whether all, or only some, scan chain outputs are enabled and fed through the compactor. A second flag register determines if the scan chain selected by the selector register is enabled and all other scan chains are disabled, or the selected scan chain is disabled and all other scan chains are enabled. Other embodiments allow selective masking of a variable number of scan chain outputs.

Claims

1. A method, comprising:

receiving test response values generated during testing of an integrated circuit, the test response values being responsive to deterministic test patterns applied to the integrated circuit;

masking one or more of the test response values before the one or more of the test response values are input into one or more compactors, the one or more masked test response values including one or more unknown test response values or one or more test response values showing a fault effect, at least one of the one or more compactors comprising a feedback-free network of XOR or XNOR gates; and

compacting the test response values, including the one or more masked test response values, in the one or more compactors.

2. The method of claim 1, wherein the masking is performed in response to one or more control signals generated by control logic.

3. The method of claim 2, further comprising generating the one or more control signals in the control logic by loading control bits into one or more control registers and decoding the control bits into the control signals.

4. The method of claim 1, wherein the masking includes masking all test response values to a test pattern for an input of one of the one or more compactors.

5. The method of claim 1, wherein the masking includes masking the one or more of the test response values on a clock-cycle-by-clock-cycle basis.

6. The method of claim 1, wherein the masking includes masking the one or more of the test response values on a test-pattern-by-test-pattern basis.

7. The method of claim 1, further comprising comparing the compacted test response values to a fault-free response to determine if there is a match.

8. The method of claim 1, wherein the one or more masked test response values are known values.

9. The method of claim 1, wherein the one or more test response values are output from scan chains in the integrated circuit.

10. A system, comprising:

means for masking one or more test response values generated during testing of an integrated circuit before the one or more test response values are compacted, the test response values being responsive to deterministic test patterns applied to the integrated circuit, the one or more masked test response values including one or more unknown test response values or one or more test response values showing a fault effect; and

means for compacting the test response values, including the one or more masked test response values, the means for compacting the test response values comprising a feedback-free network of XOR or XNOR gates.

11. The system of claim 10, wherein the means for masking operates in response to one or more control signals generated by control logic.

12. The system of claim 11, wherein the means for masking further comprises means for loading control bits into one or more control registers and means for decoding the control bits into the control signals.

13. The system of claim 10, wherein the means for masking includes means for masking all test response values to a test pattern for a respective input of the means for compacting the test response values.

14. The system of claim 10, wherein the means for masking includes means for masking the one or more test response values on a clock-cycle-by-clock-cycle basis.

15. The system of claim 10, wherein the means for masking includes means for masking the one or more test response values on a test-pattern-by-test-pattern basis.

16. The system of claim 10, further comprising means for comparing the compacted test response values to a fault-free response to determine if there is a match.

17. The system of claim 10, wherein the one or more masked test response values are known values.