Analysis method, exposure method, and device manufacturing method
First Claim
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1. An analysis method for analyzing an exposure defect of a substrate exposed via a liquid, the method comprising:
- a first measuring process, which measures an abnormality of the substrate after the substrate is exposed via the liquid and before the substrate is developed;
a second measuring process, which measures an abnormality of the substrate after the substrate has been developed, andan analyzing process, which analyzes an exposure defect of the substrate based on a comparison of a measurement result of the first measuring process and a measurement result of the second measuring process,wherein the exposure via the liquid, which causes exposure defects, is executed prior to the first measuring process and the second measuring process.
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Abstract
An analysis method includes a developing process (SA60), which develops the substrate, a first measuring process (SA50), which measures the abnormalities of the pre-development substrate, a second measuring process (SA70), which measures the abnormalities of the post-development substrate, and an analyzing process (SA80), which analyzes the exposure defects of a substrate exposed via a liquid based on the measurements results of the first measuring process (SA50) and the measurement results of the second measuring process (SA70).
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Citations
16 Claims
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1. An analysis method for analyzing an exposure defect of a substrate exposed via a liquid, the method comprising:
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a first measuring process, which measures an abnormality of the substrate after the substrate is exposed via the liquid and before the substrate is developed; a second measuring process, which measures an abnormality of the substrate after the substrate has been developed, and an analyzing process, which analyzes an exposure defect of the substrate based on a comparison of a measurement result of the first measuring process and a measurement result of the second measuring process, wherein the exposure via the liquid, which causes exposure defects, is executed prior to the first measuring process and the second measuring process. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An analysis method for analyzing an exposure defect of a substrate exposed via a liquid, the method comprising:
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a measuring process, which measures and images an abnormality of the substrate after the substrate has been developed, and an analyzing process, which analyzes an exposure defect of the substrate based on a comparison of an imaged result of the measuring process and an image obtained after exposure of the substrate via the liquid and prior to the development of the substrate, wherein the exposure via the liquid, which causes the exposure defect, is executed prior to the measuring process.
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13. An exposure method that exposes a substrate via a liquid, the method comprising:
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obtaining a relationship between a receding contact angle of the liquid on a film that forms an uppermost layer of the substrate prior to exposure of the substrate and a defect level of the substrate after the substrate has been exposed, the defect level being defined by at least one of a defect density and a number of defects on the substrate; exposing the substrate using the obtained relationship; and setting a movement velocity of the substrate during exposure according to the receding contact angle to reduce exposure defects. - View Dependent Claims (16)
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14. An exposure method that exposes a substrate via a liquid, the method comprising:
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obtaining a relationship between a receding contact angle of the liquid on a film that forms an uppermost layer of the substrate prior to exposure of the substrate and a defect level of the substrate after the substrate has been exposed, the defect level being defined by at least one of a defect density and a number of defects on the substrate; exposing the substrate using the obtained relationship; and varying one of an acceleration or movement direction of the substrate during exposure according to the receding contact angle to reduce exposure defects.
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15. An exposure method that exposes a substrate via a liquid, the method comprising:
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obtaining a relationship between a receding contact angle of the liquid on a film that forms an uppermost layer of the substrate prior to exposure of the substrate and a defect level of the substrate after the substrate has been exposed, the defect level being defined by at least one of a defect density and a number of defects on the substrate; exposing the substrate using the obtained relationship; and varying a supply amount of the liquid during exposure according to the receding contact angle to reduce exposure defects.
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Specification